AAAAAA

   
Results: 1-12 |
Results: 12
Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity - art. no. 075310
Authors: Im, HJ Ding, Y Pelz, JP Choyke, WJ
Citation: Hj. Im et al., Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity - art. no. 075310, PHYS REV B, 6407(7), 2001, pp. 5310
Anisotropy of mass transport on Si(001) surfaces heated with direct current
Authors: Nielsen, JF Pettersen, MS Pelz, JP
Citation: Jf. Nielsen et al., Anisotropy of mass transport on Si(001) surfaces heated with direct current, SURF SCI, 480(1-2), 2001, pp. 84-96
Enhanced terrace stability for preparation of step-free Si(001)-(2x1) surfaces - art. no. 136103
Authors: Nielsen, JF Pelz, JP Hibino, H Hu, CW Tsong, IST
Citation: Jf. Nielsen et al., Enhanced terrace stability for preparation of step-free Si(001)-(2x1) surfaces - art. no. 136103, PHYS REV L, 8713(13), 2001, pp. 6103
Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy - art. no. 106802
Authors: Im, HJ Ding, Y Pelz, JP Heying, B Speck, JS
Citation: Hj. Im et al., Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy - art. no. 106802, PHYS REV L, 8710(10), 2001, pp. 6802
Controlled striped phase formation on ultraflat Si(001) surfaces during diborane exposure
Authors: Nielsen, JF Pelz, JP Hibino, H Hu, CW Tsong, IST Kouvetakis, J
Citation: Jf. Nielsen et al., Controlled striped phase formation on ultraflat Si(001) surfaces during diborane exposure, APPL PHYS L, 79(23), 2001, pp. 3857-3859
Observation of direct-current-induced step bending patterns on Si(001)
Authors: Nielsen, JF Pelz, JP Pettersen, MS
Citation: Jf. Nielsen et al., Observation of direct-current-induced step bending patterns on Si(001), SURF REV L, 7(5-6), 2000, pp. 577-582
Effect of tensile strain on B-type step energy on Si(001)-(2x1) surfaces determined by switch-kink counting
Authors: Heller, ER Jones, DE Pelz, JP Xie, YH Silverman, PJ
Citation: Er. Heller et al., Effect of tensile strain on B-type step energy on Si(001)-(2x1) surfaces determined by switch-kink counting, J VAC SCI A, 17(4), 1999, pp. 1663-1669
Scanning tunneling microscope studies of boron-doped Si(001)
Authors: Nielsen, JF Im, HJ Pelz, JP Krueger, M Borovsky, B Ganz, E
Citation: Jf. Nielsen et al., Scanning tunneling microscope studies of boron-doped Si(001), J VAC SCI A, 17(4), 1999, pp. 1670-1675
Ultrahigh vacuum dual fluid line rotatable connector
Authors: Kaczer, B Jones, DE Im, HJ Pelz, JP
Citation: B. Kaczer et al., Ultrahigh vacuum dual fluid line rotatable connector, J VAC SCI A, 17(2), 1999, pp. 674-675
Effect of surface steps on oxide-cluster nucleation and sticking of oxygenon Si(001) surfaces
Authors: Brichzin, V Pelz, JP
Citation: V. Brichzin et Jp. Pelz, Effect of surface steps on oxide-cluster nucleation and sticking of oxygenon Si(001) surfaces, PHYS REV B, 59(15), 1999, pp. 10138-10144
Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy (vol 73, pg 1871, 1998)
Authors: Kaczer, B Im, HJ Pelz, JP Wallace, RM
Citation: B. Kaczer et al., Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy (vol 73, pg 1871, 1998), APPL PHYS L, 74(3), 1999, pp. 478-478
Comment on "Step faceting at the (001) surface of boron doped silicon"
Authors: Pelz, JP Ebner, C Jones, DE Hong, Y Bauer, E Tsong, IST
Citation: Jp. Pelz et al., Comment on "Step faceting at the (001) surface of boron doped silicon", PHYS REV L, 81(24), 1998, pp. 5473-5473
Risultati: 1-12 |