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Citation: E. Simoen et al., Electrical characterization of shallow cobalt-silicided junctions, J MAT S-M E, 12(4-6), 2001, pp. 207-210

Authors: Lukyanchikova, N Garbar, N Petrichuk, M Simoen, E Claeys, C

Citation: N. Lukyanchikova et al., Flicker noise in deep submicron nMOS transistors, SOL ST ELEC, 44(7), 2000, pp. 1239-1245