AAAAAA

   
Results: 1-11 |
Results: 11
Focusing of low energy electrons by submicrometer patterned structures in low energy electron microscopy
Authors: Kan, HC Phaneuf, RJ
Citation: Hc. Kan et Rj. Phaneuf, Focusing of low energy electrons by submicrometer patterned structures in low energy electron microscopy, J VAC SCI B, 19(4), 2001, pp. 1158-1163
Scanning tunneling spectroscopy of field-induced Au nanodots on ultrathin oxides on Si(100)
Authors: Park, JY Phaneuf, RJ Williams, ED
Citation: Jy. Park et al., Scanning tunneling spectroscopy of field-induced Au nanodots on ultrathin oxides on Si(100), J VAC SCI B, 19(2), 2001, pp. 523-526
Photon energy dependence of contrast in photoelectron emission microscopy of Si devices
Authors: Ballarotto, VW Siegrist, K Phaneuf, RJ Williams, ED Yang, WC Nemanich, RJ
Citation: Vw. Ballarotto et al., Photon energy dependence of contrast in photoelectron emission microscopy of Si devices, APPL PHYS L, 78(22), 2001, pp. 3547-3549
Variation of threshold field in field induced fabrication of Au nanodots on ultrathin in situ grown silicon oxide
Authors: Park, JY Phaneuf, RJ Williams, ED
Citation: Jy. Park et al., Variation of threshold field in field induced fabrication of Au nanodots on ultrathin in situ grown silicon oxide, SURF SCI, 470(1-2), 2000, pp. L69-L74
PEEM imaging of dopant contrast in Si(001)
Authors: Ballarotto, VW Siegrist, K Phaneuf, RJ Williams, ED Mogren, S
Citation: Vw. Ballarotto et al., PEEM imaging of dopant contrast in Si(001), SURF SCI, 461(1-3), 2000, pp. L570-L574
Imaging the variation in band bending across a silicon pn junction surfaceusing spectromicroscopy
Authors: Phaneuf, RJ Kan, HC Marsi, M Gregoratti, L Gunther, S Kiskinova, M
Citation: Rj. Phaneuf et al., Imaging the variation in band bending across a silicon pn junction surfaceusing spectromicroscopy, J APPL PHYS, 88(2), 2000, pp. 863-868
Observations of reversible and irreversible structural transitions of cobalt on Si(111) with LEEM
Authors: Phaneuf, RJ Hong, Y Horch, S Bennett, PA
Citation: Rj. Phaneuf et al., Observations of reversible and irreversible structural transitions of cobalt on Si(111) with LEEM, MICRON, 30(1), 1999, pp. 13-20
Nonuniversality in mound formation during semiconductor growth
Authors: Lengel, G Phaneuf, RJ Williams, ED Das Sarma, S Beard, W Johnson, FG
Citation: G. Lengel et al., Nonuniversality in mound formation during semiconductor growth, PHYS REV B, 60(12), 1999, pp. R8469-R8472
Ni/Si(111) system: Formation and evolution of two- and three-dimensional phases studied by spectromicroscopy
Authors: Gregoratti, L Gunther, S Kovac, J Marsi, M Phaneuf, RJ Kiskinova, M
Citation: L. Gregoratti et al., Ni/Si(111) system: Formation and evolution of two- and three-dimensional phases studied by spectromicroscopy, PHYS REV B, 59(3), 1999, pp. 2018-2024
Equilibration of ring-cluster surface phases and silicide islands for Co adsorbed on Si(111)
Authors: Phaneuf, RJ Bennett, PA Marsi, M Gunther, S Gregoratti, L Casalis, L Kiskinova, M
Citation: Rj. Phaneuf et al., Equilibration of ring-cluster surface phases and silicide islands for Co adsorbed on Si(111), SURF SCI, 431(1-3), 1999, pp. 232-241
LEEM studies of phase separations and surface depletion of Co and Ni on Si(111)
Authors: Phaneuf, RJ Bennett, PA
Citation: Rj. Phaneuf et Pa. Bennett, LEEM studies of phase separations and surface depletion of Co and Ni on Si(111), SURF REV L, 5(6), 1998, pp. 1179-1188
Risultati: 1-11 |