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Results: 1-25 | 26-36 |
Results: 26-36/36
Suicide and social change in China
Authors: Phillips, MR Liu, HQ Zhang, YP
Citation: Mr. Phillips et al., Suicide and social change in China, CULT MED PS, 23(1), 1999, pp. 25-50
Direct experimental evidence for the role of oxygen in the luminescent properties of GaN
Authors: Toth, M Fleischer, K Phillips, MR
Citation: M. Toth et al., Direct experimental evidence for the role of oxygen in the luminescent properties of GaN, PHYS REV B, 59(3), 1999, pp. 1575-1578
Double-blind photoarray administration as a safeguard against investigatorbias
Authors: Phillips, MR McAuliff, BD Kovera, MB Cutler, BL
Citation: Mr. Phillips et al., Double-blind photoarray administration as a safeguard against investigatorbias, J APPL PSYC, 84(6), 1999, pp. 940-951
WDM lightwave system crosstalk by optical Kerr effect with polarisation-dependent loss
Authors: Phillips, MR Ott, DM
Citation: Mr. Phillips et Dm. Ott, WDM lightwave system crosstalk by optical Kerr effect with polarisation-dependent loss, ELECTR LETT, 35(20), 1999, pp. 1764-1765
Randomised trial of different rates of feeding in acute diarrhoea
Authors: Wan, C Phillips, MR Dibley, MJ Liu, Z
Citation: C. Wan et al., Randomised trial of different rates of feeding in acute diarrhoea, ARCH DIS CH, 81(6), 1999, pp. 487-491
Detection of Cr impurities in GaN by room temperature cathodoluminescence spectroscopy
Authors: Toth, M Phillips, MR
Citation: M. Toth et Mr. Phillips, Detection of Cr impurities in GaN by room temperature cathodoluminescence spectroscopy, APPL PHYS L, 75(25), 1999, pp. 3983-3985
Depletion layer imaging using a gaseous secondary electron detector in an environmental scanning electron microscope
Authors: Phillips, MR Toth, M Drouin, D
Citation: Mr. Phillips et al., Depletion layer imaging using a gaseous secondary electron detector in an environmental scanning electron microscope, APPL PHYS L, 75(1), 1999, pp. 76-78
Depth profiling of GaN by cathodoluminescence microanalysis
Authors: Fleischer, K Toth, M Phillips, MR Zou, J Li, G Chua, SJ
Citation: K. Fleischer et al., Depth profiling of GaN by cathodoluminescence microanalysis, APPL PHYS L, 74(8), 1999, pp. 1114-1116
Dislocation-induced changes in quantum dots: Step alignment and radiative emission
Authors: Leon, R Okuno, JO Lawton, RA Stevens-Kalceff, M Phillips, MR Zou, J Cockayne, DJH Lobo, C
Citation: R. Leon et al., Dislocation-induced changes in quantum dots: Step alignment and radiative emission, APPL PHYS L, 74(16), 1999, pp. 2301-2303
Identification and mapping of the amorphous phase in plasma-sprayed hydroxyapatite coatings using scanning cathodoluminescence microscopy
Authors: Gross, KA Phillips, MR
Citation: Ka. Gross et Mr. Phillips, Identification and mapping of the amorphous phase in plasma-sprayed hydroxyapatite coatings using scanning cathodoluminescence microscopy, J MAT S-M M, 9(12), 1998, pp. 797-802
Influence of the surface morphology on the yellow and "edge" emissions in wurtzite GaN
Authors: Godlewski, M Goldys, EM Phillips, MR Langer, R Barski, A
Citation: M. Godlewski et al., Influence of the surface morphology on the yellow and "edge" emissions in wurtzite GaN, APPL PHYS L, 73(25), 1998, pp. 3686-3688
Risultati: 1-25 | 26-36 |