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Results:
1-14
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Results: 14
Authors:
Pickering, C
Citation: C. Pickering, Special issue - Optical techniques - Editorial, SURF INT AN, 31(10), 2001, pp. 907-907
Authors:
Pickering, C
Citation: C. Pickering, Optical characterization techniques for process monitoring, SURF INT AN, 31(10), 2001, pp. 909-914
Authors:
Pickering, C
Citation: C. Pickering, Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces, SURF INT AN, 31(10), 2001, pp. 927-937
Authors:
Balmer, RS
Pickering, C
Kier, AM
Birbeck, JCH
Saker, M
Martin, T
Citation: Rs. Balmer et al., In situ optical monitoring of AlGaN thickness and composition during MOVPEgrowth of AlGaN/GaN microwave HFETs, J CRYST GR, 230(3-4), 2001, pp. 361-367
Authors:
Allwood, DA
Carline, RT
Mason, NJ
Pickering, C
Tanner, BK
Walker, PJ
Citation: Da. Allwood et al., Characterization of oxide layers on GaAs substrates, THIN SOL FI, 364(1-2), 2000, pp. 33-39
Authors:
Robbins, DJ
Pickering, C
Russell, J
Carline, RT
Dann, AW
Marrs, AD
Glasper, JL
Citation: Dj. Robbins et al., In situ optical monitoring for SiGe epitaxy, J CRYST GR, 209(2-3), 2000, pp. 290-296
Authors:
Pickering, C
Citation: C. Pickering, Towards a more venturesome Europe, NATURE, 401(6750), 1999, pp. 209-210
Authors:
Pickering, C
Citation: C. Pickering, Bigger is better!, FORBES, 1999, pp. 8-8
Authors:
Pickering, C
Citation: C. Pickering, Meet the schwillionaires, FORBES, 1999, pp. 34-34
Authors:
Amer, S
Pickering, C
Lajoie, S
Citation: S. Amer et al., The rag trade: A history of fabrics and fashion technology, FORBES, 1999, pp. 42
Authors:
Pickering, C
Citation: C. Pickering, Blue-mountain - An exclusive look at the world's most powerful computer, FORBES, 1999, pp. 50-54
Authors:
Pickering, C
Citation: C. Pickering, Off off off Wall Street, FORBES, 1999, pp. 61
Authors:
Pickering, C
Citation: C. Pickering, Silicon man lives - Just ask Peter Cochrane, FORBES, 1999, pp. 82-82
Authors:
Pickering, C
Citation: C. Pickering, Web services, FORBES, 1999, pp. 201
Risultati:
1-14
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