Authors: Pirovano, A Lacaita, AL Pacelli, A Benvenuti, A

Citation: A. Pirovano et al., Novel low-temperature C-V technique for MOS doping profile determination near the Si/SiO2 interface, IEEE DEVICE, 48(4), 2001, pp. 750-757

Authors: Pirovano, A Rubolini, D De Michelis, S

Citation: A. Pirovano et al., Winter roost occupancy and behaviour at evening departure of urban long-eared owls, ITAL J ZOOL, 67(1), 2000, pp. 63-66

Authors: Pirovano, A Lacaita, AL Ghidini, G Tallarida, G

Citation: A. Pirovano et al., On the correlation between surface roughness and inversion layer mobility in Si-MOSFET's, IEEE ELEC D, 21(1), 2000, pp. 34-36

Authors: Pirovano, A Lacaita, AL Zandler, G Oberhuber, R

Citation: A. Pirovano et al., Explaining the dependences of the hole and electron mobilities in Si inversion layers, IEEE DEVICE, 47(4), 2000, pp. 718-724

Authors: Pirovano, A Rubolini, D Brambilla, S Ferrari, N

Citation: A. Pirovano et al., Winter diet of urban roosting Long-eared Owls Asio otus in northern Italy:the importance of the Brown Rat Rattus norvegicus, BIRD STUDY, 47, 2000, pp. 242-244

Authors: Mazzoni, G Lacaita, AL Perron, LM Pirovano, A

Citation: G. Mazzoni et al., On surface roughness-limited mobility in highly doped n-MOSEET's, IEEE DEVICE, 46(7), 1999, pp. 1423-1428