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Citation: Vv. Polonski et al., Vacuum shear force microscopy application to high resolution work, JPN J A P 2, 38(7B), 1999, pp. L826-L829

Authors: Polonski, VV Yamamoto, Y Kourogi, M Fukuda, H Ohtsu, M

Citation: Vv. Polonski et al., Nanometric patterning of zinc by optical near-field photochemical vapour deposition, J MICROSC O, 194, 1999, pp. 545-551