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Results:
1-3
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Results: 3
Authors:
Copel, M
Cartier, E
Gusev, EP
Guha, S
Bojarczuk, N
Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001) (vol 78, pg 2670, 2001), APPL PHYS L, 78(26), 2001, pp. 4199-4199
Authors:
Copel, M
Cartier, E
Gusev, EP
Guha, S
Bojarczuk, N
Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001), APPL PHYS L, 78(18), 2001, pp. 2670-2672
Authors:
Poppeller, M
Cartier, E
Tromp, RM
Citation: M. Poppeller et al., Hot Electron Emission Lithography: a method for efficient large area e-beam projection, MICROEL ENG, 46(1-4), 1999, pp. 183-186
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1-3
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