AAAAAA

   
Results: 1-9 |
Results: 9
MODELING AND EXPERIMENTAL-STUDY OF HEAT DEPOSITION AND TRANSPORT IN ASEMICONDUCTOR-LASER DIODE
Authors: LEWIS D DILHAIRE S PHAN T QUINTARD V HORNUNG V CLAEYS W
Citation: D. Lewis et al., MODELING AND EXPERIMENTAL-STUDY OF HEAT DEPOSITION AND TRANSPORT IN ASEMICONDUCTOR-LASER DIODE, Microelectronics, 29(4-5), 1998, pp. 171-179
THERMOREFLECTANCE MEASUREMENTS OF TRANSIENT TEMPERATURE UPON INTEGRATED-CIRCUITS - APPLICATION TO THERMAL-CONDUCTIVITY IDENTIFICATION
Authors: PHAN T DILHAIRE S QUINTARD V CLAEYS W BATSALE JC
Citation: T. Phan et al., THERMOREFLECTANCE MEASUREMENTS OF TRANSIENT TEMPERATURE UPON INTEGRATED-CIRCUITS - APPLICATION TO THERMAL-CONDUCTIVITY IDENTIFICATION, Microelectronics, 29(4-5), 1998, pp. 181-190
THE METHOD OF DYNAMIC SEPARATION AND ITS APPLICATION TO QUANTITATIVE THERMAL-ANALYSIS OF MICROELECTRONIC DEVICES BY LASER INTERFEROMETRY AND REFLECTOMETRY
Authors: PHAN T DILHAIRE S QUINTARD V LEWIS D CLAEYS W
Citation: T. Phan et al., THE METHOD OF DYNAMIC SEPARATION AND ITS APPLICATION TO QUANTITATIVE THERMAL-ANALYSIS OF MICROELECTRONIC DEVICES BY LASER INTERFEROMETRY AND REFLECTOMETRY, Measurement science & technology, 8(3), 1997, pp. 303-316
THERMOMECHANICAL STUDY OF ALCU BASED INTERCONNECT UNDER PULSED THERMOELECTRIC EXCITATION
Authors: PHAN T DILHAIRE S QUINTARD V LEWIS D CLAEYS W
Citation: T. Phan et al., THERMOMECHANICAL STUDY OF ALCU BASED INTERCONNECT UNDER PULSED THERMOELECTRIC EXCITATION, Journal of applied physics, 81(3), 1997, pp. 1157-1168
LASER PROBE MEASUREMENTS OF QUALITY EVOLUTION OF SOLDER JOINTS DURINGTHERMAL CYCLING AGING TESTS
Authors: QUINTARD V PARMENTIER B PHAN T LEWIS D DILHAIRE S CLAEYS W
Citation: V. Quintard et al., LASER PROBE MEASUREMENTS OF QUALITY EVOLUTION OF SOLDER JOINTS DURINGTHERMAL CYCLING AGING TESTS, Quality and reliability engineering international, 12(6), 1996, pp. 447-452
LASER-BEAM THERMOGRAPHY OF CIRCUITS IN THE PARTICULAR CASE OF PASSIVATED SEMICONDUCTORS
Authors: QUINTARD V DEBOY G DILHAIRE S LEWIS D PHAN T CLAEYS W
Citation: V. Quintard et al., LASER-BEAM THERMOGRAPHY OF CIRCUITS IN THE PARTICULAR CASE OF PASSIVATED SEMICONDUCTORS, Microelectronic engineering, 31(1-4), 1996, pp. 291-298
OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS
Authors: CLAEYS W DILHAIRE S LEWIS D QUINTARD V PHAN T AUCOUTURIER JL
Citation: W. Claeys et al., OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS, Quality and reliability engineering international, 11(4), 1995, pp. 247-251
INTERFERENCES OF PELTIER THERMAL WAVES PRODUCED IN OHMIC CONTACTS UPON INTEGRATED-CIRCUITS
Authors: CLAEYS W DILHAIRE S QUINTARD V LEWIS D PHAN T AUCOUTURIER JL
Citation: W. Claeys et al., INTERFERENCES OF PELTIER THERMAL WAVES PRODUCED IN OHMIC CONTACTS UPON INTEGRATED-CIRCUITS, Journal de physique. IV, 4(C7), 1994, pp. 195-198
LASER PROBING OF THERMAL-BEHAVIOR OF ELECTRONIC COMPONENTS AND ITS APPLICATION IN QUALITY AND RELIABILITY TESTING
Authors: CLAEYS W DILHAIRE S QUINTARD V
Citation: W. Claeys et al., LASER PROBING OF THERMAL-BEHAVIOR OF ELECTRONIC COMPONENTS AND ITS APPLICATION IN QUALITY AND RELIABILITY TESTING, Microelectronic engineering, 24(1-4), 1994, pp. 411-420
Risultati: 1-9 |