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KITAGAWARA Y
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RADZIMSKI Z
ROZGONYI GA
GONZALEZ F
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BROWN RA
KONONCHUK O
BONDARENKO I
ROMANOWSKI A
RADZIMSKI Z
ROZGONYI GA
GONZALEZ F
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RADZIMSKI Z
ROZGONYI GA
GONZALEZ F
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RADZIMSKI Z
BUCZKOWSKI A
ROZGONYI GA
Citation: Hr. Kirk et al., LOW-TEMPERATURE IDENTIFICATION OF INTERFACIAL AND BULK DEFECTS IN AL SIO2/SI CAPACITOR STRUCTURES BY ELECTRON-BEAM-INDUCED CURRENT/, I.E.E.E. transactions on electron devices, 41(6), 1994, pp. 959-963