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Results: 4

Authors: INGVARSON F RAGNARSSON LA LUNDGREN P
Citation: F. Ingvarson et al., RECOVERY AND STRESS DYNAMICS IN BIPOLAR-TRANSISTORS AND MOS DEVICES, Microelectronics and reliability, 38(6-8), 1998, pp. 1109-1113

Authors: LANDHEER D RAGNARSSON LA BELKOUCH S
Citation: D. Landheer et al., PHYSICAL AND ELECTRICAL ANALYSIS OF SILICON DIOXIDE THIN-FILMS PRODUCED BY ELECTRON-CYCLOTRON-RESONANCE CHEMICAL-VAPOR-DEPOSITION, Microelectronic engineering, 36(1-4), 1997, pp. 53-60

Authors: RAGNARSSON LA LUNDGREN P JAUHIAINEN A
Citation: La. Ragnarsson et al., ELECTRICAL RELIABILITY OF ULTRA-THIN REMOTE PLASMA-DEPOSITED OXIDES ON SILICON, Microelectronic engineering, 36(1-4), 1997, pp. 65-67

Authors: RAGNARSSON LA LUNDGREN P OVUKA Z ANDERSSON MO
Citation: La. Ragnarsson et al., OXIDE THICKNESS-DEPENDENCE AND BIAS-DEPENDENCE OF POSTMETALLIZATION ANNEALING OF INTERFACE STATES IN METAL-OXIDE-SILICON DIODES, Journal of the Electrochemical Society, 144(5), 1997, pp. 1866-1869
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