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Results:
1-9
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Results: 9
Authors:
RAO MVH
MATHUR BK
CHOPRA KL
Citation: Mvh. Rao et al., DETECTION OF SURFACE LATTICE-DEFECTS USING LINE SCAN METHOD, Bulletin of Materials Science, 19(2), 1996, pp. 417-422
Authors:
SRINIVAS V
AYYAR SR
RAO MVH
MATHUR BK
CHOPRA KL
Citation: V. Srinivas et al., FRACTAL ANALYSIS OF FIELD-INDUCED EFFECTS ON THIN-FILMS OF NICKEL, Materials research bulletin, 31(2), 1996, pp. 197-205
Authors:
BABU R
RAO MVH
MURALIKRISHNA S
Citation: R. Babu et al., COTTON (GOSSYPIUM HIRSUTUM)-BASED MULTIPLE CROPPING SYSTEMS FOR SUSTAINED YIELD, Indian Journal of Agricultural Sciences, 66(10), 1996, pp. 577-580
Authors:
BABU R
RAO MVH
MURALIKRISHNA S
GURUMURTY R
KRISHNAPPA MR
Citation: R. Babu et al., EFFECT OF CHEMICAL DEFOLIANTS ON EARLINESS, SEED-COTTON YIELD AND QUALITY OF UPLAND COTTON (GOSSYPIUM-HIRSUTUM) UNDER IRRIGATED CONDITION, Indian Journal of Agronomy, 40(1), 1995, pp. 157-159
Authors:
RAO MVH
SRINIVAS V
RAO VV
MATHUR BK
CHOPRA KL
Citation: Mvh. Rao et al., OBSERVATION OF FIELD-INDUCED FRAGMENTATION OF NICKEL CLUSTERS USING SCANNING-TUNNELING-MICROSCOPY, Applied surface science, 89(4), 1995, pp. 417-421
Authors:
RAO MVH
MATHUR BK
CHOPRA KL
Citation: Mvh. Rao et al., SCANNING-TUNNELING-MICROSCOPY STUDIES OF NUCLEATION AND GROWTH OF SILVER FILMS, Journal of Materials Science, 30(10), 1995, pp. 2682-2685
Authors:
SRINIVAS V
RAO MVH
MATHUR BK
CHOPRA KL
Citation: V. Srinivas et al., CREATION OF NANOSTRUCTURES ON NICKEL THIN-FILMS BY STM, Bulletin of Materials Science, 17(6), 1994, pp. 841-848
Authors:
RAO MVH
MATHUR BK
CHOPRA KL
Citation: Mvh. Rao et al., EVALUATION OF THE SCALING EXPONENT OF SELF-AFFINE FRACTAL SURFACE FROM A SINGLE SCANNING PROBE MICROSCOPE IMAGE, Applied physics letters, 65(1), 1994, pp. 124-126
Authors:
RAO MVH
MATHUR BK
Citation: Mvh. Rao et Bk. Mathur, SHARP TUNGSTEN TIPS FOR SCANNING TUNNELING MICROSCOPE PREPARED BY ELECTROCHEMICAL ETCHING PROCESS, Indian Journal of Pure & Applied Physics, 31(8), 1993, pp. 574-576
Risultati:
1-9
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