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PARSONS WM
BALLARD EO
BARTSCH RR
BENAGE JF
BENNETT GA
BOWERS RL
BOWMAN DW
BROWNELL JH
COCHRANE JC
DAVIS HA
EKDAHL CA
GRIBBLE RF
GRIEGO JR
GOLDSTONE PD
JONES ME
HINCKLEY WB
HOSACK KW
KASIK RJ
LEE H
LOPEZ EA
LINDEMUTH IR
MONROE MD
MOSES RW
NEY SA
PLATTS D
REASS WA
SALAZAR HR
SANDOVAL GM
SCUDDER DW
SHLACHTER JS
THOMPSON MC
TRAINOR RJ
VALDEZ GA
WATT RG
WURDEN GA
YOUNGER SM
Citation: Wm. Parsons et al., THE ATLAS PROJECT - A NEW PULSED-POWER FACILITY FOR HIGH-ENERGY DENSITY PHYSICS EXPERIMENTS, IEEE transactions on plasma science, 25(2), 1997, pp. 205-211
Authors:
DAVIS HA
OLSON JC
REASS WA
BARNES CW
BARTSCH RR
COATES DM
HUNT JW
SCHLEINITZ HM
LOVBERG RH
GREENLY JB
Citation: Ha. Davis et al., PROGRESS TOWARD A MICROSECOND DURATION, REPETITIVELY PULSED, INTENSE-ION BEAM FOR ACTIVE SPECTROSCOPIC MEASUREMENTS ON ITER, Review of scientific instruments, 68(1), 1997, pp. 332-335
Authors:
IVERS TH
EISNER E
GAROFALO A
KOMBARGI R
MAUEL ME
MAURER D
NADLE D
NAVRATIL GA
SANKAR MKV
SU M
TAYLOR E
XIAO Q
BARTSCH RR
REASS WA
WURDEN GA
Citation: Th. Ivers et al., OBSERVATION OF WALL STABILIZATION AND ACTIVE CONTROL OF LOW-N MAGNETOHYDRODYNAMIC INSTABILITIES IN A TOKAMAK, Physics of plasmas, 3(5), 1996, pp. 1926-1934
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Authors:
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FAEHL RJ
HENINS F
NASTASI M
REASS WA
REJ DJ
SCHEUER JT
WALTER KC
WOOD BP
Citation: Cp. Munson et al., RECENT ADVANCES IN PLASMA SOURCE ION-IMPLANTATION AT LOS-ALAMOS NATIONAL LABORATORY, Surface & coatings technology, 84(1-3), 1996, pp. 528-536
Authors:
WOOD BP
HENINS I
REASS WA
REJ DJ
DAVIS HA
WAGANAAR WJ
MUENCHAUSEN RE
JOHNSTON GP
SCHMIDT HK
Citation: Bp. Wood et al., LARGE-SCALE IMPLANTATION AND DEPOSITION RESEARCH AT LOS-ALAMOS-NATIONAL-LABORATORY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 429-434
Authors:
WOOD BP
HENINS I
GRIBBLE RJ
REASS WA
FAEHL RJ
NASTASI MA
REJ DJ
Citation: Bp. Wood et al., INITIAL OPERATION OF A LARGE-SCALE PLASMA SOURCE ION-IMPLANTATION EXPERIMENT, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 870-874