Authors: BOHNE W REINSPERGER GU ROHRICH J ROSCHERT G SELLE B

Citation: W. Bohne et al., COMPOSITION ANALYSIS OF CO DOPED FESIX FILMS BY COMBINING STANDARD AND HEAVY-ION RBS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 273-277

Authors: SCHOPKE A SELLE B SIEBER I REINSPERGER GU STAUSS P HERZ K POWALLA M

Citation: A. Schopke et al., CHARACTERIZATION OF THE STOICHIOMETRY OF COEVAPORATED FESIX FILMS BY AES, EDX, RES, AND ELECTRON-MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 322-325

Authors: DOSCHER M OERTEL G REINSPERGER GU SELLE B SIEBER I TROPPENZ U

Citation: M. Doscher et al., COMBINATION OF RBS ANALYSIS AND INFRARED VIBRATIONAL SPECTROSCOPY FORTHE CHARACTERIZATION OF SEMICONDUCTING BETA-FESI2 FILMS, Mikrochimica acta, 125(1-4), 1997, pp. 257-261

Authors: FENSKE F LANGE H OERTEL G REINSPERGER GU SCHUMANN J SELLE B

Citation: F. Fenske et al., CHARACTERIZATION OF SEMICONDUCTING SILICIDE FILMS BY INFRARED VIBRATIONAL SPECTROSCOPY, Materials chemistry and physics, 43(3), 1996, pp. 238-242

Authors: LANGE H HENRION W SELLE B REINSPERGER GU OERTEL G VONKANEL H

Citation: H. Lange et al., OPTICAL-PROPERTIES OF BETA-FESI2 FILMS GROWN ON SI SUBSTRATES WITH DIFFERENT DEGREE OF STRUCTURAL PERFECTION, Applied surface science, 102, 1996, pp. 169-172

Authors: REINSPERGER GU SCHOPKE A SELLE B

Citation: Gu. Reinsperger et al., QUANTITATIVE COMPOSITION ANALYSIS OF SEMICONDUCTING SILICIDE FILMS, Physica status solidi. a, Applied research, 145(2), 1994, pp. 425-428