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Results: 2

Authors: BRUGGEMANN R ROJAHN M ROSCH M
Citation: R. Bruggemann et al., NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON, Physica status solidi. a, Applied research, 166(2), 1998, pp. 11-12

Authors: BRUGGEMANN R HIERZENBERGER A REINIG P ROJAHN M SCHUBERT MB SCHWEIZER S WANKA HN ZRINSCAK I
Citation: R. Bruggemann et al., ELECTRONIC AND OPTICAL-PROPERTIES OF HOT-WIRE-DEPOSITED MICROCRYSTALLINE SILICON, Journal of non-crystalline solids, 230, 1998, pp. 982-986
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