Citation: R. Bruggemann et al., NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON, Physica status solidi. a, Applied research, 166(2), 1998, pp. 11-12
Authors:
BRUGGEMANN R
HIERZENBERGER A
REINIG P
ROJAHN M
SCHUBERT MB
SCHWEIZER S
WANKA HN
ZRINSCAK I
Citation: R. Bruggemann et al., ELECTRONIC AND OPTICAL-PROPERTIES OF HOT-WIRE-DEPOSITED MICROCRYSTALLINE SILICON, Journal of non-crystalline solids, 230, 1998, pp. 982-986