Authors:
FELDMANN B
ROPPISCHER H
KIUNKE W
EISELE J
Citation: B. Feldmann et al., CHARACTERIZATION OF DELTA-DOPED SILICON BY ELECTROLYTE ELECTROREFLECTANCE, Physica status solidi. a, Applied research, 152(1), 1995, pp. 171-177
Citation: H. Roppischer et al., FLAT-BAND POTENTIAL STUDIES AT THE N-SI ELECTROLYTE INTERFACE BY ELECTROREFLECTANCE AND C-V MEASUREMENTS/, Journal of the Electrochemical Society, 142(2), 1995, pp. 650-655
Authors:
SHOKHOVETS SV
DOMANEVSKI DS
GORUPA KS
ROPPISCHER H
Citation: Sv. Shokhovets et al., EXTINCTION OF INFRARED RADIATION BY OXIDIZED AND HEAT-TREATED GAAS, Physica status solidi. a, Applied research, 146(2), 1994, pp. 639-652