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Authors:
ROUQUETTE P
GASQUET D
BARBEROUSSE F
DERAEDT W
BAEYENS Y
Citation: P. Rouquette et al., INFLUENCE OF KINK EFFECT ON NOISE MEASUREMENTS IN INP SUBSTRATE PHEMTS AT MICROWAVE-FREQUENCIES, Solid-state electronics, 39(10), 1996, pp. 1423-1426