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Results:
1-8
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Results: 8
Authors:
Sarkar, DK
Rau, I
Falke, M
Giesler, H
Teichert, S
Beddies, G
Hinneberg, HJ
Citation: Dk. Sarkar et al., Structure, interface roughness, and growth mechanism of reactive deposition epitaxy of CoSi2 on Si(100) substrates, APPL PHYS L, 78(23), 2001, pp. 3604-3606
Authors:
Zaharescu, M
Crisan, M
Jitianu, A
Crisan, D
Meghea, A
Rau, I
Citation: M. Zaharescu et al., SiO2-iron oxide composites obtained by sol-gel method, J SOL-GEL S, 19(1-3), 2000, pp. 631-635
Authors:
Peleanu, I
Zaharescu, M
Rau, I
Crisan, M
Jitianu, A
Meghea, A
Citation: I. Peleanu et al., Composite SiO2-iron oxide materials for magnetically intensified adsorption, J RAD NUCL, 246(3), 2000, pp. 557-563
Authors:
Rau, I
Gonzalo, A
Valiente, M
Citation: I. Rau et al., Arsenic(V) removal from aqueous solutions by iron(III) loaded chelating resin, J RAD NUCL, 246(3), 2000, pp. 597-600
Authors:
Olowolafe, JO
Rau, I
Unruh, KM
Swann, CP
Jawad, ZS
Alford, T
Citation: Jo. Olowolafe et al., Effect of composition on thermal stability and electrical resistivity of Ta-Si-N films, THIN SOL FI, 365(1), 2000, pp. 19-21
Authors:
Kolodzey, J
Chowdhury, EA
Adam, TN
Qui, GH
Rau, I
Olowolafe, JO
Suehle, JS
Chen, Y
Citation: J. Kolodzey et al., Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon, IEEE DEVICE, 47(1), 2000, pp. 121-128
Authors:
Olowolafe, JO
Rau, I
Unruh, KM
Swann, CP
Jawad, Z
Alford, T
Citation: Jo. Olowolafe et al., The effect of Ta to Si ratio on magnetron sputtered Ta-Si-N thin films, J ELEC MAT, 28(12), 1999, pp. 1399-1402
Authors:
Rau, I
Putzka, A
Citation: I. Rau et A. Putzka, Helium and neon implantation and memory observed in a quadrupole mass spectrometer, NUCL INST B, 155(1-2), 1999, pp. 53-59
Risultati:
1-8
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