Authors: Chang, SC Rau, JC

Citation: Sc. Chang et Jc. Rau, A timing-driven pseudoexhaustive testing for VLSI circuits, IEEE COMP A, 20(1), 2001, pp. 147-158

Authors: Rau, JC Jone, WB Chang, SC Wu, YL

Citation: Jc. Rau et al., Tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits, IEE P-COM D, 147(5), 2000, pp. 343-348