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Results: 2
A timing-driven pseudoexhaustive testing for VLSI circuits
Authors:
Chang, SC Rau, JC
Citation:
Sc. Chang et Jc. Rau, A timing-driven pseudoexhaustive testing for VLSI circuits, IEEE COMP A, 20(1), 2001, pp. 147-158
Tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
Authors:
Rau, JC Jone, WB Chang, SC Wu, YL
Citation:
Jc. Rau et al., Tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits, IEE P-COM D, 147(5), 2000, pp. 343-348
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