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Gimeno, IM
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Citation: I. Pomeranz et Sm. Reddy, On diagnosis and diagnostic test generation for pattern-dependent transition faults, IEEE COMP A, 20(6), 2001, pp. 791-800
Citation: I. Pomeranz et Sm. Reddy, Vector replacement to improve static-test compaction for synchronous sequential circuits, IEEE COMP A, 20(2), 2001, pp. 336-342
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