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Results: 1-4 |
Results: 4
Use of focused ion beam (FIB) for advanced interpretation of microindentation test results applied to cementitious composites
Authors: Trtik, P Reeves, CM Bartos, PJM
Citation: P. Trtik et al., Use of focused ion beam (FIB) for advanced interpretation of microindentation test results applied to cementitious composites, MATER STRUC, 33(227), 2000, pp. 189-193
Cantilever technique for the preparation of cross sections for transmission electron microscopy using a focused ion beam workstation
Authors: Langford, RM Reeves, CM Goodall, JG Findlay, J Jeffree, CE
Citation: Rm. Langford et al., Cantilever technique for the preparation of cross sections for transmission electron microscopy using a focused ion beam workstation, J VAC SCI B, 18(1), 2000, pp. 100-103
Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests
Authors: Trtik, P Reeves, CM Bartos, PJM
Citation: P. Trtik et al., Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests, J MAT SCI L, 19(10), 2000, pp. 903-905
Fabrication of photonic band gap structures in As40S60 by focused ion beammilling
Authors: Dale, G Langford, RM Ewen, PJS Reeves, CM
Citation: G. Dale et al., Fabrication of photonic band gap structures in As40S60 by focused ion beammilling, J NON-CRYST, 266, 2000, pp. 913-918
Risultati: 1-4 |