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Results: 1-10 |
Results: 10
Binding state information from XPS depth profiling: capabilities and limits
Authors: Oswald, S Reiche, R
Citation: S. Oswald et R. Reiche, Binding state information from XPS depth profiling: capabilities and limits, APPL SURF S, 179(1-4), 2001, pp. 307-315
XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)-silicon thin films
Authors: Reiche, R Oswald, S Wetzig, K
Citation: R. Reiche et al., XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)-silicon thin films, APPL SURF S, 179(1-4), 2001, pp. 316-323
Pyramid formation on a high index copper bicrystal during bombardment with10 keV argon and krypton ions
Authors: Reiche, R Hauffe, W
Citation: R. Reiche et W. Hauffe, Pyramid formation on a high index copper bicrystal during bombardment with10 keV argon and krypton ions, APPL SURF S, 165(4), 2000, pp. 279-287
The transformation of beta-FeSi2 under Ar ion bombardment studied by XPS, AES and Mossbauer spectroscopy
Authors: Reiche, R Oswald, S Wetzig, K Dobler, M Reuther, H Walterfang, M
Citation: R. Reiche et al., The transformation of beta-FeSi2 under Ar ion bombardment studied by XPS, AES and Mossbauer spectroscopy, NUCL INST B, 160(3), 2000, pp. 397-407
Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies
Authors: Reiche, R Yubero, F Espinos, JP Gonzalez-Elipe, AR
Citation: R. Reiche et al., Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies, SURF SCI, 457(1-2), 2000, pp. 199-210
XPS depth profile analysis of a thin non-conducting titanate superlattice
Authors: Oswald, S Hassler, W Reiche, R Lindner, J Weiss, F
Citation: S. Oswald et al., XPS depth profile analysis of a thin non-conducting titanate superlattice, MIKROCH ACT, 133(1-4), 2000, pp. 303-306
Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM
Authors: Reiche, R Oswald, S Hofman, D Thomas, J Wetzig, K
Citation: R. Reiche et al., Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM, FRESEN J AN, 365(1-3), 1999, pp. 76-82
Chemical analysis of thin films by means of SS-MS, GD-OES, and XBS demonstrated at Ir-Si thermoelectrica
Authors: Kurt, R Hoffmann, V Reiche, R Pitschke, W Wetzig, K
Citation: R. Kurt et al., Chemical analysis of thin films by means of SS-MS, GD-OES, and XBS demonstrated at Ir-Si thermoelectrica, FRESEN J AN, 363(2), 1999, pp. 179-184
XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films
Authors: Reiche, R Thielsch, R Oswald, S Wetzig, K
Citation: R. Reiche et al., XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films, J ELEC SPEC, 104(1-3), 1999, pp. 161-171
Subject, patient, outside world.
Authors: Reiche, R
Citation: R. Reiche, Subject, patient, outside world., PSYCHE-Z, 53(6), 1999, pp. 572-596
Risultati: 1-10 |