Authors: Rey-Tauriac, Y Taurin, M Bonnaud, O

Citation: Y. Rey-tauriac et al., Wafer level accelerated test for ionic contamination control on VDMOS transistors in bipolar/CMOS/DMOS, MICROEL REL, 41(9-10), 2001, pp. 1331-1334

Authors: Gagnard, X Rey-Tauriac, Y Bonnaud, O

Citation: X. Gagnard et al., Polysilicon oxide quality optimization at wafer level of a Bipolar/CMOS/DMOS technology, MICROEL REL, 41(9-10), 2001, pp. 1335-1340

Authors: Rey-Tauriac, Y Taurin, M Bonnaud, O

Citation: Y. Rey-tauriac et al., High reliability power VDMOS transistors in bipolar/CMOS/DMOS technology, MICROEL REL, 41(9-10), 2001, pp. 1707-1712