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Results:
1-18
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Results: 18
Authors:
Lukacs, IE
Riesz, F
Citation: Ie. Lukacs et F. Riesz, Imaging-limiting effects of apertures in Makyoh-topography instruments, MEAS SCI T, 12(8), 2001, pp. N29-N33
Authors:
Riesz, F
Dobos, L
Vignali, C
Pelosi, C
Citation: F. Riesz et al., Thermal decomposition of InP surfaces: volatile component loss, morphological changes, and pattern formation, MAT SCI E B, 80(1-3), 2001, pp. 54-59
Authors:
Riesz, F
Citation: F. Riesz, Makyoh topography for the morphological study of compound semiconductor wafers and structures, MAT SCI E B, 80(1-3), 2001, pp. 220-223
Authors:
Nemcsics, A
Riesz, F
Citation: A. Nemcsics et F. Riesz, Influence of lattice mismatch and growth rate on the decay of RHEED oscillation in the case of InGaAs/GaAs growth, CRYST RES T, 36(8-10), 2001, pp. 1011-1017
Authors:
Lukacs, IE
Riesz, F
Citation: Ie. Lukacs et F. Riesz, A simple algorithm for the reconstruction of surface topography from Makyoh-topography images, CRYST RES T, 36(8-10), 2001, pp. 1059-1064
Authors:
Riesz, F
Ryc, L
Badziak, J
Pfeifer, M
Citation: F. Riesz et al., Pulse response of GaAs and InP photoconductive detectors for the X-ray diagnostics of laser plasmas, NUCL INST A, 474(2), 2001, pp. 151-158
Authors:
Riesz, F
Citation: F. Riesz, Camera length and field of view in Makyoh-topography instruments, REV SCI INS, 72(2), 2001, pp. 1591-1593
Authors:
Riesz, F
Zytkiewicz, ZR
Citation: F. Riesz et Zr. Zytkiewicz, The application of Makyoh topography for the study of GaAs layers grown byepitaxial lateral overgrowth, J CRYST GR, 222(4), 2001, pp. 741-746
Authors:
Riesz, F
Citation: F. Riesz, Makyoh-topography study of grooves scratched and etched in single-crystal semiconductors, MATER LETT, 46(5), 2000, pp. 291-295
Authors:
Nemcsics, A
Riesz, F
Szabo, J
Horvath, ZE
Gurban, S
Citation: A. Nemcsics et al., Makyoh topography study of the curvature and surface morphology of mismatched InGaAs/GaAs heterostructures, PHYS ST S-A, 177(1), 2000, pp. 231-236
Authors:
Riesz, F
Citation: F. Riesz, Geometrical optical model of the image formation in Makyoh (magic-mirror) topography, J PHYS D, 33(23), 2000, pp. 3033-3040
Authors:
Riesz, F
Citation: F. Riesz, A quantitative approach to Makyoh (magic-mirror) topography, J CRYST GR, 210(1-3), 2000, pp. 370-374
Authors:
Nemcsics, A
Riesz, F
Dobos, L
Citation: A. Nemcsics et al., Selective electrochemical profiling of threading defects in mismatched heteroepitaxial systems, THIN SOL FI, 344, 1999, pp. 520-523
Authors:
Kinder, R
Nemcsics, A
Harman, R
Riesz, F
Pecz, B
Citation: R. Kinder et al., Carrier profiling of a heterojunction bipolar transistor and p-i-n photodiode structures by electrochemical C-V technique, PHYS ST S-A, 175(2), 1999, pp. 631-636
Authors:
Nemcsics, A
Riesz, F
Dobos, L
Citation: A. Nemcsics et al., Selective electrochemical profiting of threading dislocations in mismatched InGaAs/GaAs heteroepitaxial systems, PHYS ST S-A, 171(1), 1999, pp. 283-288
Authors:
Riesz, F
Citation: F. Riesz, Makyoh topography for the study of large-area extended defects in semiconductors, PHYS ST S-A, 171(1), 1999, pp. 403-409
Authors:
Riesz, F
Toth, AL
Ryc, L
Slysz, W
Wegrzecki, M
Citation: F. Riesz et al., The EBIC study of boundary effects in the SiPIN photodiodes for X-ray detector applications, NUKLEONIKA, 44(4), 1999, pp. 635-646
Authors:
Ryc, L
Riesz, F
Citation: L. Ryc et F. Riesz, Potential application of the AlGaAs/GaAs heterostructure photodiodes for laser-plasma diagnostics, NUKLEONIKA, 44(4), 1999, pp. 647-655
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1-18
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