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Results: 1-13 |
Results: 13
X-ray reflectivity of silicon on insulator wafers
Authors: Eymery, J Rieutord, F Fournel, F Buttard, D Moriceau, H
Citation: J. Eymery et al., X-ray reflectivity of silicon on insulator wafers, MAT SC S PR, 4(1-3), 2001, pp. 31-33
Structure and elastic properties of 10-12 pentacosadiyonic acid Langmuir films
Authors: Gourier, C Alba, M Braslau, A Daillant, J Goldmann, M Knobler, CM Rieutord, F Zalczer, G
Citation: C. Gourier et al., Structure and elastic properties of 10-12 pentacosadiyonic acid Langmuir films, LANGMUIR, 17(21), 2001, pp. 6496-6505
Adsorbed organic monolayers on crystalline substrate: the example of 8CB on MoS2
Authors: Lacaze, E Alba, M Goldmann, M Michel, JP Rieutord, F
Citation: E. Lacaze et al., Adsorbed organic monolayers on crystalline substrate: the example of 8CB on MoS2, APPL SURF S, 175, 2001, pp. 337-343
High-energy x-ray reflectivity of buried interfaces created by wafer bonding - art. no. 125408
Authors: Rieutord, F Eymery, J Fournel, F Buttard, D Oeser, R Plantevin, O Moriceau, H Aspar, B
Citation: F. Rieutord et al., High-energy x-ray reflectivity of buried interfaces created by wafer bonding - art. no. 125408, PHYS REV B, 6312(12), 2001, pp. 5408
Thermodynamics and X-ray studies of 2-alcohol monolayers: Two-dimensional phase diagrams
Authors: Alonso, C Artzner, F Lajzerowicz, J Grubel, G Boudet, N Rieutord, F Petit, JM Renault, A
Citation: C. Alonso et al., Thermodynamics and X-ray studies of 2-alcohol monolayers: Two-dimensional phase diagrams, EUR PHY J E, 3(1), 2000, pp. 63-70
Determination of residual stresses in grazing incidence - Synchrotron radiation
Authors: Sicardy, O Touet, I Rieutord, F Eymery, J
Citation: O. Sicardy et al., Determination of residual stresses in grazing incidence - Synchrotron radiation, J PHYS IV, 10(P10), 2000, pp. 103-113
Spreading dynamics of water droplets
Authors: Rieutord, F Rayssac, O Moriceau, H
Citation: F. Rieutord et al., Spreading dynamics of water droplets, PHYS REV E, 62(5), 2000, pp. 6861-6864
Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Authors: Buttard, D Eymery, J Rieutord, F Fournel, F Lubbert, D Baumbach, T Moriceau, H
Citation: D. Buttard et al., Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces, PHYSICA B, 283(1-3), 2000, pp. 103-107
Growth of two-dimensional solids in alcohol monolayers in the presence of soluble amphiphilic molecules
Authors: Lenne, PF Bonosi, F Renault, A Bellet-Amalric, E Legrand, JF Petit, JM Rieutord, F Berge, B
Citation: Pf. Lenne et al., Growth of two-dimensional solids in alcohol monolayers in the presence of soluble amphiphilic molecules, LANGMUIR, 16(5), 2000, pp. 2306-2310
Resonant x-ray diffraction study of a new brominated chiral SmCA liquid crystal
Authors: Cluzeau, P Gisse, P Ravaine, V Levelut, AM Barois, P Huang, CC Rieutord, F Nguyen, HT
Citation: P. Cluzeau et al., Resonant x-ray diffraction study of a new brominated chiral SmCA liquid crystal, FERROELECTR, 244(1-4), 2000, pp. 301-318
X-ray reflectivity investigation of thin p-type porous silicon layers
Authors: Buttard, D Dolino, G Bellet, D Baumbach, T Rieutord, F
Citation: D. Buttard et al., X-ray reflectivity investigation of thin p-type porous silicon layers, SOL ST COMM, 109(1), 1999, pp. 1-5
X-ray reflectivity of ultrathin twist-bonded silicon wafers
Authors: Eymery, J Fournel, F Rieutord, F Buttard, D Moriceau, H Aspar, B
Citation: J. Eymery et al., X-ray reflectivity of ultrathin twist-bonded silicon wafers, APPL PHYS L, 75(22), 1999, pp. 3509-3511
X-ray study of the fluctuations and the interfacial structure of a phospholipid monolayer at an alkane-water interface
Authors: Fradin, C Luzet, D Braslau, A Alba, M Muller, F Daillant, J Petit, JM Rieutord, F
Citation: C. Fradin et al., X-ray study of the fluctuations and the interfacial structure of a phospholipid monolayer at an alkane-water interface, LANGMUIR, 14(26), 1998, pp. 7327-7330
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