Authors: Ragnarsson, LA Guha, S Bojarczuk, NA Cartier, E Fischetti, MV Rim, K Karasinski, J

Citation: La. Ragnarsson et al., Electrical characterization of Al2O3 n-channel MOSFETs with aluminum gates, IEEE ELEC D, 22(10), 2001, pp. 490-492

Authors: Koester, SJ Rim, K Chu, JO Mooney, PM Ott, JA Hargrove, MA

Citation: Sj. Koester et al., Effect of thermal processing on strain relaxation and interdiffusion in Si/SiGe heterostructures studied using Raman spectroscopy, APPL PHYS L, 79(14), 2001, pp. 2148-2150

Authors: Kim, SM McCulloch, TM Rim, K

Citation: Sm. Kim et al., Pharyngeal pressure analysis by the finite element method during liquid bolus swallow, ANN OTOL RH, 109(6), 2000, pp. 585-589

Authors: Kim, SM McCulloch, TM Rim, K

Citation: Sm. Kim et al., Comparison of viscoelastic properties of the pharyngeal tissue: Human and canine, DYSPHAGIA, 14(1), 1999, pp. 8-16

Authors: Singh, DV Rim, K Mitchell, TO Hoyt, JL Gibbons, JF

Citation: Dv. Singh et al., Measurement of the conduction band offsets in Si/Si1-x-yGexCy and Si/Si1-yCy heterostructures using metal-oxide-semiconductor capacitors, J APPL PHYS, 85(2), 1999, pp. 978-984

Authors: Singh, DV Rim, K Mitchell, TO Hoyt, JL Gibbons, JF

Citation: Dv. Singh et al., Admittance spectroscopy analysis of the conduction band offsets in Si/Si1-x-yGexCy and Si/Si1-yCy heterostructures, J APPL PHYS, 85(2), 1999, pp. 985-993