Authors:
Ro, CU
Oh, KY
Kim, H
Chun, YS
Osan, J
de Hoog, J
Van Grieken, R
Citation: Cu. Ro et al., Chemical speciation of individual atmospheric particles using low-Z electron probe X-ray microanalysis: characterizing "Asian Dust" deposited with rainwater in Seoul, Korea, ATMOS ENVIR, 35(29), 2001, pp. 4995-5005
Authors:
Osan, J
de Hoog, J
Van Espen, P
Szaloki, I
Ro, CU
Van Grieken, R
Citation: J. Osan et al., Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles, X-RAY SPECT, 30(6), 2001, pp. 419-426
Authors:
Ro, CU
Oh, KY
Kim, H
Kim, YP
Lee, CB
Kim, KH
Kang, CH
Osan, J
De Hoog, J
Worobiec, A
Van Grieken, R
Citation: Cu. Ro et al., Single-particle analysis of aerosols at Cheju Island, Korea, using low-Z electron probe X-ray microanalysis: A direct proof of nitrate formation fromsea salts, ENV SCI TEC, 35(22), 2001, pp. 4487-4494
Authors:
Ro, CU
Oh, KY
Osan, J
de Hoog, J
Worobiec, A
Van Grieken, R
Citation: Cu. Ro et al., Heterogeneity assessment in individual CaCO3-CaSO4 particles using ultrathin window electron probe x-ray microanalysis, ANALYT CHEM, 73(19), 2001, pp. 4574-4583
Authors:
Osan, J
de Hoog, J
Worobiec, A
Ro, CU
Oh, KY
Szaloki, I
Van Grieken, R
Citation: J. Osan et al., Application of chemometric methods for classification of atmospheric particles based on thin-window electron probe microanalysis data, ANALYT CHIM, 446(1-2), 2001, pp. 211-222
Citation: I. Szaloki et al., Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation, SPECT ACT B, 55(7), 2000, pp. 1017-1030
Authors:
Ro, CU
Osan, J
Szaloki, I
Oh, KY
Kim, H
Van Grieken, R
Citation: Cu. Ro et al., Determination of chemical species in individual aerosol particles using ultrathin window EPMA, ENV SCI TEC, 34(14), 2000, pp. 3023-3030
Citation: Cu. Ro et al., Determination of low-Z elements in individual environmental particles using windowless EPMA, ANALYT CHEM, 71(8), 1999, pp. 1521-1528
Citation: Cu. Ro et al., Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis, ANALYT CHIM, 389(1-3), 1999, pp. 151-160