Authors:
Schnabel, RF
Clevenger, LA
Costrini, G
Dobuzinsky, DM
Filippi, R
Gambino, J
Lee, GY
Iggulden, RC
Lin, C
Lu, ZG
Ning, XJ
Ramachandran, R
Ronay, M
Tobben, D
Weber, SJ
Citation: Rf. Schnabel et al., Aluminum dual damascene metallization for 0.175 mu m DRAM generations and beyond - (invited), MICROEL ENG, 50(1-4), 2000, pp. 265-270