Authors: Stevens, KS Rotem, S Ginosar, R Beerel, P Myers, CJ Yun, KY Kol, R Dike, C Roncken, M

Citation: Ks. Stevens et al., An asynchronous instruction length decoder, IEEE J SOLI, 36(2), 2001, pp. 217-228

Authors: Roncken, M

Citation: M. Roncken, Defect-oriented testability for asynchronous IC's, P IEEE, 87(2), 1999, pp. 363-375