Authors:
Bozzo, S
Lazzari, JL
Hollander, B
Coudreau, C
Ronda, A
Mantl, S
D'Avitaya, FA
Derrien, J
Citation: S. Bozzo et al., Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition, APPL SURF S, 164, 2000, pp. 35-41