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Results: 51-72/72
Authors:
Jiang, HG
Ruhle, M
Lavernia, EJ
Citation: Hg. Jiang et al., On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials, J MATER RES, 14(2), 1999, pp. 549-559
Authors:
Zhu, JH
Brunner, K
Abstreiter, G
Kienzle, O
Ernst, F
Ruhle, M
Citation: Jh. Zhu et al., Correlated SiGe wires shaped by regular step bunches on miscut Si(113) substrates, PHYS REV B, 60(15), 1999, pp. 10935-10940
Authors:
Ruhle, M
Citation: M. Ruhle, Untitled, Z METALLKUN, 90(12), 1999, pp. 954-955
Authors:
Ernst, F
Raj, R
Ruhle, M
Citation: F. Ernst et al., Nanomechanical modeling of misfit dislocations at heterointerfaces, Z METALLKUN, 90(12), 1999, pp. 961-977
Authors:
Langjahr, PA
Wagner, T
Lange, FF
Ruhle, M
Citation: Pa. Langjahr et al., Phase separation and epitaxial stabilization in BaCe0.5Zr0.5O3-films on SrTiO3, Z METALLKUN, 90(12), 1999, pp. 978-982
Authors:
Zalar, A
Baretzky, BMM
Hofmann, S
Ruhle, M
Panjan, P
Citation: A. Zalar et al., Interfacial reactions in Al2O3/Ti, Al2O3/Ti3Al and Al2O3/TiAl bilayers, THIN SOL FI, 352(1-2), 1999, pp. 151-155
Authors:
Polli, AD
Wagner, T
Ruhle, M
Citation: Ad. Polli et al., Effect of Ca impurities and wet chemical etching on the surface morphologyof SrTiO3 substrates, SURF SCI, 429(1-3), 1999, pp. 237-245
Authors:
Ernst, F
Mayer, J
Ruhle, M
Citation: F. Ernst et al., Untitled, J MICROSC O, 194, 1999, pp. 1-1
Authors:
Schweinfest, R
Ernst, F
Wagner, T
Ruhle, M
Citation: R. Schweinfest et al., High-precision assessment of interface lattice offset by quantitative HRTEM, J MICROSC O, 194, 1999, pp. 142-151
Authors:
Akatsu, T
Hosoda, N
Suga, T
Ruhle, M
Citation: T. Akatsu et al., Atomic structure of Al/Al interface formed by surface activated bonding, J MATER SCI, 34(17), 1999, pp. 4133-4139
Authors:
Strecker, A
Mayer, J
Baretzky, B
Eigenthaler, U
Gemming, T
Schweinfest, R
Ruhle, M
Citation: A. Strecker et al., Optimization of TEM specimen preparation by double-sided ion beam thinningunder low angles, J ELEC MICR, 48(3), 1999, pp. 235-244
Authors:
Kohler-Redlich, P
Terrones, M
Manteca-Diego, C
Hsu, WK
Terrones, H
Ruhle, M
Kroto, HW
Walton, DRM
Citation: P. Kohler-redlich et al., Stable BC2N nanostructures: low-temperature production of segregated C/BN layered materials, CHEM P LETT, 310(5-6), 1999, pp. 459-465
Authors:
Terrones, M
Terrones, H
Grobert, N
Hsu, WK
Zhu, YQ
Hare, JP
Kroto, HW
Walton, DRM
Kohler-Redlich, P
Ruhle, M
Zhang, JP
Cheetham, AK
Citation: M. Terrones et al., Efficient route to large arrays of CNx nanofibers by pyrolysis of ferrocene/melamine mixtures, APPL PHYS L, 75(25), 1999, pp. 3932-3934
Authors:
Grobert, N
Hsu, WK
Zhu, YQ
Hare, JP
Kroto, HW
Walton, DRM
Terrones, M
Terrones, H
Redlich, P
Ruhle, M
Escudero, R
Morales, F
Citation: N. Grobert et al., Enhanced magnetic coercivities in Fe nanowires, APPL PHYS L, 75(21), 1999, pp. 3363-3365
Authors:
Han, WQ
Redlich, P
Ernst, F
Ruhle, M
Citation: Wq. Han et al., Synthesizing boron nitride nanotubes filled with SiC nanowires by using carbon nanotubes as templates, APPL PHYS L, 75(13), 1999, pp. 1875-1877
Authors:
Wei, BQ
Spolenak, R
Kohler-Redlich, P
Ruhle, M
Arzt, E
Citation: Bq. Wei et al., Electrical transport in pure and boron-doped carbon nanotubes, APPL PHYS L, 74(21), 1999, pp. 3149-3151
Authors:
Kienzle, O
Ernst, F
Ruhle, M
Schmidt, OG
Eberl, K
Citation: O. Kienzle et al., Germanium "quantum dots" embedded in silicon: Quantitative study of self-alignment and coarsening, APPL PHYS L, 74(2), 1999, pp. 269-271
Authors:
Carroll, DL
Wagner, T
Ruhle, M
Citation: Dl. Carroll et al., Nanofaceting of the LiNbO3 surface studied by scanning tunneling microscopy, APPL PHYS L, 74(1), 1999, pp. 46-48
Authors:
Gulgun, MA
Putlayev, V
Ruhle, M
Citation: Ma. Gulgun et al., Effects of yttrium doping alpha-alumina: I, microstructure and microchemistry, J AM CERAM, 82(7), 1999, pp. 1849-1856
Authors:
Ernst, F
Recnik, A
Langjahr, PA
Nellist, PD
Ruhle, M
Citation: F. Ernst et al., Atomistic structure of misfit dislocations in SrZrO3/SrTiO3 interfaces, ACT MATER, 47(1), 1998, pp. 183-198
Authors:
Gu, H
Pan, XQ
Cannon, RM
Ruhle, M
Citation: H. Gu et al., Dopant distribution in grain-boundary films in calcia-doped silicon nitride ceramics, J AM CERAM, 81(12), 1998, pp. 3125-3135
Authors:
Ching, WY
Xu, YN
Gale, JD
Ruhle, M
Citation: Wy. Ching et al., Ab-initio total energy calculation of alpha- and beta-silicon nitride and the derivation of effective pair potentials with application to lattice dynamics, J AM CERAM, 81(12), 1998, pp. 3189-3196