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Authors:
Wu, CT
Ridley, R
Roman, P
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Hao, J
Ruzyllo, J
Citation: Ct. Wu et al., The effect of surface treatments and growth conditions on electrical characteristics of thick (> 50 nm) gate oxides, J ELCHEM SO, 148(9), 2001, pp. F184-F188
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Kamieniecki, E
Ruzyllo, J
Citation: P. Roman et al., Characterization of conductive oxides on silicon using non-contact surfacecharge profiling, MICROEL ENG, 48(1-4), 1999, pp. 181-184
Authors:
Brubaker, M
Roman, P
Staffa, J
Ruzyllo, J
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