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Results:
1-8
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Results: 8
Authors:
Lee, DO
Roman, P
Wu, CT
Mahoney, W
Horn, M
Mumbauer, P
Brubaker, M
Grant, R
Ruzyllo, J
Citation: Do. Lee et al., Studies of mist deposited high-k dielectrics for MOS gates, MICROEL ENG, 59(1-4), 2001, pp. 405-408
Authors:
Lukasiak, L
Roman, P
Jakubowski, A
Ruzyllo, J
Citation: L. Lukasiak et al., Analysis of surface and interface charge interactions in silicon on insulator (SOI) substrates, SOL ST ELEC, 45(1), 2001, pp. 95-100
Authors:
Wu, CT
Ridley, R
Roman, P
Dolny, G
Grebs, T
Hao, J
Ruzyllo, J
Citation: Ct. Wu et al., The effect of surface treatments and growth conditions on electrical characteristics of thick (> 50 nm) gate oxides, J ELCHEM SO, 148(9), 2001, pp. F184-F188
Authors:
Ruzyllo, J
Rohr, E
Baeyens, M
Mertens, P
Heyns, M
Citation: J. Ruzyllo et al., Fluorine in thermal oxides from HF preoxidation surface treatments, EL SOLID ST, 2(7), 1999, pp. 336-338
Authors:
Roman, P
Lee, DO
Brubaker, M
Kamieniecki, E
Ruzyllo, J
Citation: P. Roman et al., Characterization of conductive oxides on silicon using non-contact surfacecharge profiling, MICROEL ENG, 48(1-4), 1999, pp. 181-184
Authors:
Heyns, M
Mertens, PW
Ruzyllo, J
Lee, MYM
Citation: M. Heyns et al., Advanced wet and dry cleaning coming together for next generation, SOL ST TECH, 42(3), 1999, pp. 37
Authors:
Staffa, J
Fakhouri, S
Brubaker, M
Roman, P
Ruzyllo, J
Citation: J. Staffa et al., Effects controlling initiation and termination of gas-phase cleaning reactions, J ELCHEM SO, 146(1), 1999, pp. 321-326
Authors:
Brubaker, M
Roman, P
Staffa, J
Ruzyllo, J
Citation: M. Brubaker et al., Monitoring of chemical oxide removal from silicon surfaces using a surfacephotovoltage technique, EL SOLID ST, 1(3), 1998, pp. 130-132
Risultati:
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