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Authors: PRIVITERA V SAGGIO MG MAGRI A
Citation: V. Privitera et al., ONE-DIMENSIONAL AND 2-DIMENSIONAL CHARACTERIZATION OF POWER METAL-OXIDE-SEMICONDUCTOR STRUCTURE BY SPREADING RESISTANCE PROFILING - FROM THE PROFILES TO THE I-V CURVES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 369-372

Authors: GALVAGNO G LAVIA F SAGGIO MG LAMANTIA A RIMINI E
Citation: G. Galvagno et al., 2-DIMENSIONAL ALUMINUM DIFFUSION IN SILICON - EXPERIMENTAL RESULTS AND SIMULATIONS, Journal of the Electrochemical Society, 142(5), 1995, pp. 1585-1590
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