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Results: 1-17 |
Results: 17

Authors: MARINELLI M MESSINA G MILANI E PAOLETTI A SANTANGELO S TUCCIARONE A RINATI GV
Citation: M. Marinelli et al., NATURE OF BAND-A CATHODOLUMINESCENCE IN CVD DIAMOND FILMS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 20(7-8), 1998, pp. 1193-1200

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., NUMERICAL APPROXIMATION OF THE PHYSICAL LAWS GOVERNING SCATTERING IN ELECTRON-BEAM LITHOGRAPHY, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 20(7-8), 1998, pp. 1201-1208

Authors: FOLSTEIN S HAINES J LANDA R PIVEN J SANTANGELO S SHEFFIELD V VIELAND V
Citation: S. Folstein et al., A GENOME SCREEN OF 76 FAMILIES ASCERTAINED THROUGH 2 AUTISM PROBANDS, American journal of medical genetics, 81(6), 1998, pp. 482-482

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., PHYSICAL APPROXIMANTS TO ELECTRON-SCATTERING, Microelectronic engineering, 34(2), 1997, pp. 147-154

Authors: PIVEN J PALMER P LANDA R SANTANGELO S JACOBI D CHILDRESS D
Citation: J. Piven et al., PERSONALITY AND LANGUAGE CHARACTERISTICS IN PARENTS FROM MULTIPLE-INCIDENCE AUTISM FAMILIES, American journal of medical genetics, 74(4), 1997, pp. 398-411

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., APPLICATION OF THE PI-THEOREM OF DIMENSIONAL ANALYSIS TO ELECTRON-SCATTERING IN MULTICOMPONENT SYSTEMS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 18(9), 1996, pp. 1005-1018

Authors: MESSINA G SANTANGELO S PAOLETTI A TUCCIARONE A
Citation: G. Messina et al., [[BUCKINGHAM]] APPROXIMANTS TO PHYSICAL LAWS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 17(5), 1995, pp. 523-535

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., A SINGLE QUALITY FACTOR FOR ELECTRON BACKSCATTERING FROM THIN-FILMS, Microelectronic engineering, 27(1-4), 1995, pp. 183-186

Authors: MESSINA G SANTANGELO S PAOLETTI A TUCCIARONE A
Citation: G. Messina et al., SIMULATION OF ELECTRON-SCATTERING PROPERTIES OF DIAMOND MEMBRANES IN X-RAY MASK FABRICATION, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 942-946

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., THE ROLE OF ELECTRON-SCATTERING IN X-RAY REFLECTION MASKS, Microelectronic engineering, 26(1), 1994, pp. 49-61

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., TUNGSTEN CARBON MASKS IN X-RAY PROJECTION LITHOGRAPHY/, Microelectronic engineering, 23(1-4), 1994, pp. 421-425

Authors: GOLDSTEIN JM SEIDMAN LJ SANTANGELO S KNAPP PH TSUANG MT
Citation: Jm. Goldstein et al., ARE SCHIZOPHRENIC MEN AT HIGHER RISK FOR DEVELOPMENTAL DEFICITS THAN SCHIZOPHRENIC WOMEN - IMPLICATIONS FOR ADULT NEUROPSYCHOLOGICAL FUNCTIONS, Journal of Psychiatric Research, 28(6), 1994, pp. 483-498

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., PERSPECTIVES IN ELECTRON-SCATTERING BY MICROSTRUCTURES, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 15(2-3), 1993, pp. 531-539

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., EXPERIMENTAL TEST OF HIGH-RESOLUTION PROCESS MODELING IN ELECTRON-BEAM LITHOGRAPHY AT 25 TO 50 KEV, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 15(10), 1993, pp. 1345-1359

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., ELECTRON-SCATTERING OF DIAMOND MEMBRANES IN X-RAY MASK FABRICATION, Microelectronic engineering, 21(1-4), 1993, pp. 91-94

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., ELECTRON-SCATTERING OF LOW-Z HIGH-DENSITY MATERIALS IN X-RAY MASK PATTERNING, Microelectronic engineering, 20(4), 1993, pp. 291-304

Authors: MESSINA G PAOLETTI A SANTANGELO S TUCCIARONE A
Citation: G. Messina et al., SHORT-RANGE AND LONG-RANGE SCATTERING IN ELECTRON-BEAM LITHOGRAPHY, Microelectronic engineering, 20(3), 1993, pp. 241-253
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