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SANTUCCI S
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SANTUCCI S
LOZZI L
PASSACANTANDO M
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LOZZI L
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PASSACANTANDO M
PICOZZI P
MOCCIA G
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Citation: S. Santucci et al., COMPOSITIONAL CHARACTERIZATION OF VERY THIN SIO2 SI3N4/SIO2 STACKED FILMS BY X-RAY PHOTOEMISSION SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROSCOPY TECHNIQUES/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 905-910
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GAMMAITONI L
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SANTUCCI S
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SANTUCCI S
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PASSACANTANDO M
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LOZZI L
PASSACANTANDO M
SANTUCCI S
PICOZZI P
DECRESCENZI M
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