Authors: NANDA KK SARANGI SN SAHU SN

Citation: Kk. Nanda et al., MEASUREMENT OF SURFACE-ROUGHNESS BY ATOMIC-FORCE MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY OF CDS NANOCRYSTALLINE FILMS, Applied surface science, 133(4), 1998, pp. 293-297

Authors: NANDA KK SARANGI SN MOHANTY S SAHU SN

Citation: Kk. Nanda et al., OPTICAL-PROPERTIES OF CDS NANOCRYSTALLINE FILMS PREPARED BY A PRECIPITATION TECHNIQUE, Thin solid films, 322(1-2), 1998, pp. 21-27

Authors: NANDA KK SARANGI SN

Citation: Kk. Nanda et Sn. Sarangi, ELECTRICAL-PROPERTIES OF 1N4007 SILICON DIODE, Review of scientific instruments, 68(7), 1997, pp. 2904-2908

Authors: NANDA KK SARANGI SN SAHU SN

Citation: Kk. Nanda et al., CDS NANOCRYSTALLITES - AN EFFICIENT LIGHT EMITTER, Current Science, 72(2), 1997, pp. 110-111