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Results: 1-25 | 26-38 |
Results: 26-38/38
SILICIDE FORMATION AND STABILITY OF TI SIGE AND CO/SICE/
Authors: WANG ZH ALDRICH DB CHEN YL SAYERS DE NEMANICH RJ
Citation: Zh. Wang et al., SILICIDE FORMATION AND STABILITY OF TI SIGE AND CO/SICE/, Thin solid films, 270(1-2), 1995, pp. 555-560
FORMATION OF THE FERRITIN IRON MINERAL OCCURS IN PLASTIDS - AN X-RAY-ABSORPTION SPECTROSCOPY STUDY
Authors: WALDO GS WRIGHT E WHANG ZH BRIAT JF THEIL EC SAYERS DE
Citation: Gs. Waldo et al., FORMATION OF THE FERRITIN IRON MINERAL OCCURS IN PLASTIDS - AN X-RAY-ABSORPTION SPECTROSCOPY STUDY, Plant physiology, 109(3), 1995, pp. 797-802
FILM THICKNESS EFFECTS IN THE TI-SI1-XGEX SOLID-PHASE REACTION
Authors: ALDRICH DB HECK HL CHEN YL SAYERS DE NEMANICH RJ
Citation: Db. Aldrich et al., FILM THICKNESS EFFECTS IN THE TI-SI1-XGEX SOLID-PHASE REACTION, Journal of applied physics, 78(8), 1995, pp. 4958-4965
PHASE STABILITIES AND SURFACE MORPHOLOGIES OF (TI1-XZRX)SI-2 THIN-FILMS ON SI(100)
Authors: DAO Y SAYERS DE NEMANICH RJ
Citation: Y. Dao et al., PHASE STABILITIES AND SURFACE MORPHOLOGIES OF (TI1-XZRX)SI-2 THIN-FILMS ON SI(100), Journal of applied physics, 78(11), 1995, pp. 6584-6591
STABILITY OF C54 TITANIUM GERMANOSILICIDE ON A SILICON-GERMANIUM ALLOY SUBSTRATE
Authors: ALDRICH DB CHEN YL SAYERS DE NEMANICH RJ ASHBURN SP OZTURK MC
Citation: Db. Aldrich et al., STABILITY OF C54 TITANIUM GERMANOSILICIDE ON A SILICON-GERMANIUM ALLOY SUBSTRATE, Journal of applied physics, 77(10), 1995, pp. 5107-5114
BOND-LENGTH RELAXATION IN SI1-XGEX ALLOYS
Authors: ALDRICH DB NEMANICH RJ SAYERS DE
Citation: Db. Aldrich et al., BOND-LENGTH RELAXATION IN SI1-XGEX ALLOYS, Physical review. B, Condensed matter, 50(20), 1994, pp. 15026-15033
STRUCTURAL INVESTIGATION OF THE INITIAL INTERFACE REGION FORMED BY THIN ZIRCONIUM FILMS ON SILICON(111)
Authors: EDWARDS AM DAO Y NEMANICH RJ SAYERS DE KEMNER KM
Citation: Am. Edwards et al., STRUCTURAL INVESTIGATION OF THE INITIAL INTERFACE REGION FORMED BY THIN ZIRCONIUM FILMS ON SILICON(111), Journal of applied physics, 76(8), 1994, pp. 4630-4635
STRUCTURAL AND ELECTRICAL-PROPERTIES OF (TI0.9ZR0.1)SI-2 THIN-FILMS ON SI(111)
Authors: DAO Y EDWARDS AM YING H CHEN YL SAYERS DE NEMANICH RJ
Citation: Y. Dao et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF (TI0.9ZR0.1)SI-2 THIN-FILMS ON SI(111), Applied physics letters, 65(19), 1994, pp. 2413-2415
AB-INITIO XAFS CALCULATION FOR A-AS2S3
Authors: PFEIFFER G REHR JJ SAYERS DE
Citation: G. Pfeiffer et al., AB-INITIO XAFS CALCULATION FOR A-AS2S3, JPN J A P 1, 32, 1993, pp. 32-34
EXAFS STUDY OF THE INITIAL INTERFACE REGION FORMED BY THIN ZIRCONIUM AND TITANIUM FILMS ON SILICON(111)
Authors: EDWARDS AM DAO Y NEMANICH RJ SAYERS DE
Citation: Am. Edwards et al., EXAFS STUDY OF THE INITIAL INTERFACE REGION FORMED BY THIN ZIRCONIUM AND TITANIUM FILMS ON SILICON(111), JPN J A P 1, 32, 1993, pp. 393-395
X-RAY-ABSORPTION STUDY OF THE REACTION OF ZIRCONIUM THIN-FILMS ON SILICON(111)
Authors: DAO Y EDWARDS AM NEMANICH RJ SAYERS DE
Citation: Y. Dao et al., X-RAY-ABSORPTION STUDY OF THE REACTION OF ZIRCONIUM THIN-FILMS ON SILICON(111), JPN J A P 1, 32, 1993, pp. 396-398
XAFS STUDY ON THE SOLID-STATE AMORPHIZATION OF A MECHANICALLY ALLOYEDNB-SN POWDER
Authors: NASU T EDWARDS AM CHO Y SAYERS DE KOCH CC
Citation: T. Nasu et al., XAFS STUDY ON THE SOLID-STATE AMORPHIZATION OF A MECHANICALLY ALLOYEDNB-SN POWDER, JPN J A P 1, 32, 1993, pp. 688-690
XAFS STUDY OF SOME TITANIUM-SILICON AND GERMANIUM COMPOUNDS
Authors: ALDRICH DB NEMANICH RJ SAYERS DE
Citation: Db. Aldrich et al., XAFS STUDY OF SOME TITANIUM-SILICON AND GERMANIUM COMPOUNDS, JPN J A P 1, 32, 1993, pp. 725-727
Risultati: 1-25 | 26-38 |