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Results: 1-5 |
Results: 5

Authors: TUNG RT SCHREY F
Citation: Rt. Tung et F. Schrey, INCREASED UNIFORMITY AND THERMAL-STABILITY OF COSI2 THIN-FILMS BY TI CAPPING, Applied physics letters, 67(15), 1995, pp. 2164-2166

Authors: SULLIVAN JP TUNG RT EAGLESHAM DJ SCHREY F GRAHAM WR
Citation: Jp. Sullivan et al., GIANT VARIATION IN SCHOTTKY-BARRIER HEIGHT OBSERVED IN THE CO SI SYSTEM/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1564-1570

Authors: EAGLESHAM DJ TUNG RT SULLIVAN JP SCHREY F
Citation: Dj. Eaglesham et al., INTERFACIAL DEFECTS IN SILICIDES ON SI(100) - CORELESS DEFECTS, 1 12(111) DISLOCATIONS, AND TWINNING MECHANISMS/, Journal of applied physics, 73(8), 1993, pp. 4064-4066

Authors: TUNG RT EAGLESHAM DJ SCHREY F SULLIVAN JP
Citation: Rt. Tung et al., SINGLE-CRYSTAL SI NISI2 SI(100) STRUCTURES, Journal of applied physics, 73(12), 1993, pp. 8250-8257

Authors: SULLIVAN JP GRAHAM WR TUNG RT SCHREY F
Citation: Jp. Sullivan et al., PITFALLS IN THE MEASUREMENT OF METAL P-SI CONTACTS - THE EFFECT OF HYDROGEN PASSIVATION/, Applied physics letters, 62(22), 1993, pp. 2804-2806
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