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Results: 26-27/27
Authors:
DAMMER U
ANSELMETTI D
DREIER M
FROMMER J
FUNFSCHILLING J
GERTH G
GUNTHERODT HJ
HAEFKE H
HIDBER HR
HOWALD L
HUG HJ
JUNG TH
LANG HP
LUTHI R
MEYER E
MOSER A
PARASHIKOV I
REIMANN P
RICHMOND T
RUETSCHI M
RUDIN H
SCHWARZ UD
STAUFER U
SUM R
Citation: U. Dammer et al., SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS - SELECTED EXAMPLES, Scanning, 15(5), 1993, pp. 257-264
Authors:
SCHWARZ UD
BOHONEK J
HAEFKE H
SAGER W
STEIGER R
GUNTHERODT HJ
Citation: Ud. Schwarz et al., ATOMIC-FORCE MICROSCOPY USED FOR THE CHARACTERIZATION OF PRECIPITATEDCOLLOIDAL PARTICLES, Helvetica Physica Acta, 66(4), 1993, pp. 413-414