Authors: SAMUDRA GS SEAH BP LING CH

Citation: Gs. Samudra et al., DETERMINATION OF LDD MOSFET DRAIN RESISTANCE FROM DEVICE SIMULATION, Solid-state electronics, 39(5), 1996, pp. 753-758

Authors: LING CH SAMUDRA GS SEAH BP

Citation: Ch. Ling et al., SIMULATION OF LOGARITHMIC TIME-DEPENDENCE OF HOT-CARRIER DEGRADATION IN PMOSFETS, Semiconductor science and technology, 10(12), 1995, pp. 1659-1666

Authors: LING CH SEAH BP SAMUDRA GS GAN CH

Citation: Ch. Ling et al., MEASUREMENT AND SIMULATION OF HOT-CARRIER DEGRADATION IN PMOSFET BY GATE CAPACITANCE, I.E.E.E. transactions on electron devices, 42(5), 1995, pp. 928-934