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Citation: Ra. Secco et Ps. Balog, OPTICAL ACCESS TO THE LARGE-VOLUME, HIGH-PRESSURE ENVIRONMENT, Review of scientific instruments, 69(7), 1998, pp. 2802-2803
Citation: Ra. Secco et Km. Ault, IONIC TRANSPORT AND STRUCTURE IN HIGH-PRESSURE NA2O-GEO2 GLASSES, Journal of non-crystalline solids, 238(3), 1998, pp. 244-252
Citation: Ra. Secco et Ea. Secco, STRUCTURAL AND NONSTRUCTURAL FACTORS IN FAST-ION CONDUCTION IN AG2SO4AT HIGH-PRESSURE, Physical review. B, Condensed matter, 56(6), 1997, pp. 3099-3104
Citation: Tl. Hicks et Ra. Secco, DEHYDRATION AND DECOMPOSITION OF PYROPHYLLITE AT HIGH-PRESSURES - ELECTRICAL-CONDUCTIVITY AND X-RAY-DIFFRACTION STUDIES TO 5-GPA, Canadian journal of earth sciences, 34(6), 1997, pp. 875-882
Citation: Km. Ault et Ra. Secco, HIGH-PRESSURE CONDUCTIVITY STUDY OF THE ALPHA-QUARTZ-]RUTILE TRANSFORMATION IN GEO2, Solid state communications, 98(5), 1996, pp. 449-452
Citation: Rf. Tucker et Ra. Secco, AUTOMATED MICROCORING DEVICE USING CUSTOM CORE DRILLS AND LAPIDARY TECHNIQUES, Review of scientific instruments, 67(9), 1996, pp. 3242-3244
Citation: D. Li et al., PRESSURE-INDUCED COORDINATION CHANGE OF AL IN SILICATE MELTS FROM AL K-EDGE XANES OF HIGH-PRESSURE NAALSI2O6 NAALSI3O8 GLASSES, Geophysical research letters, 22(23), 1995, pp. 3111-3114
Citation: Ge. Leblanc et Ra. Secco, HIGH-PRESSURE STOKES VISCOMETRY - A NEW IN-SITU TECHNIQUE FOR SPHERE VELOCITY DETERMINATION, Review of scientific instruments, 66(10), 1995, pp. 5015-5018
Citation: Ra. Secco et Ea. Secco, EFFECT OF PRESSURE ON THE FAST-ION CONDUCTOR AGTLSO4, Journal of physics and chemistry of solids, 56(8), 1995, pp. 1045-1051
Citation: Ra. Secco, HIGH-P,T PHYSICAL PROPERTY STUDIES OF EARTHS INTERIOR - THERMOELECTRIC-POWER OF SOLID AND LIQUID FE UP TO 6.4 GPA, Canadian journal of physics, 73(5-6), 1995, pp. 287-294
Citation: Pm. Nasch et al., A MODIFIED ULTRASONIC INTERFEROMETER FOR SOUND-VELOCITY MEASUREMENTS IN MOLTEN METALS AND ALLOYS, Review of scientific instruments, 65(3), 1994, pp. 682-688
Authors:
LI D
BANCROFT GM
KASRAI M
FLEET ME
SECCO RA
FENG XH
TAN KH
YANG BX
Citation: D. Li et al., X-RAY-ABSORPTION SPECTROSCOPY OF SILICON DIOXIDE (SIO2) POLYMORPHS - THE STRUCTURAL CHARACTERIZATION OF OPAL, The American mineralogist, 79(7-8), 1994, pp. 622-632