AAAAAA
Results:
1-7
|
Results: 7
Authors:
JOO JH
SEON JM
JEON YC
OH KY
ROH JS
KIM JJ
CHOI JT
Citation: Jh. Joo et al., INVESTIGATION OF RUTHENIUM ELECTRODES FOR (BA,SR)TIO3 THIN-FILMS, JPN J A P 1, 37(6A), 1998, pp. 3396-3401
Authors:
KANG UB
KIM YH
OH KY
SEON JM
Citation: Ub. Kang et al., THE EVALUATION OF ADHESION IN PT TIN THIN-FILMS FOR A BOTTOM ELECTRODE OF FERROELECTRIC MATERIALS/, Journal of the Korean Physical Society, 32, 1998, pp. 1660-1663
Authors:
CHOI YS
KIM SH
SONG HS
KIM CE
YANG DY
JEON YC
JOO JH
SEON JM
OH KY
Citation: Ys. Choi et al., THE FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED PLZT THIN-FILM FOR HIGH-DENSITY FERAM APPLICATION, Journal of the Korean Physical Society, 32, 1998, pp. 1687-1690
Authors:
JOO JH
JEON YC
SEON JM
OH KY
ROH JS
KIM JJ
Citation: Jh. Joo et al., EFFECTS OF POSTANNEALING ON THE CONDUCTION PROPERTIES OF PT (BA,SR)TIO3/PT CAPACITORS FOR DYNAMIC RANDOM-ACCESS MEMORY APPLICATIONS/, JPN J A P 1, 36(7A), 1997, pp. 4382-4385
Authors:
JEON YC
SEON JM
JOO JH
OH KY
ROH JS
KIM JJ
KIM DS
Citation: Yc. Jeon et al., THERMAL-STABILITY OF METAL-ELECTRODES (PT, RU, AND IR) ON POLYCRYSTALLINE SILICON IN FERROELECTRIC CAPACITORS, Integrated ferroelectrics, 17(1-4), 1997, pp. 489-500
Authors:
JEON YC
SEON JM
JOO JH
OH KY
ROH JS
KIM JJ
KIM DS
Citation: Yc. Jeon et al., THERMAL-STABILITY OF IR POLYCRYSTALLINE-SI STRUCTURE FOR BOTTOM ELECTRODE OF INTEGRATED FERROELECTRIC CAPACITORS/, Applied physics letters, 71(4), 1997, pp. 467-469
Authors:
BYUN JS
SEON JM
YOUN KS
HWANG HS
PARK JW
KIM JJ
Citation: Js. Byun et al., DEFECT GENERATION DURING EPITAXIAL COSI2 FORMATION USING CO TI BILAYER ON OXIDE PATTERNED (100)SI SUBSTRATE AND ITS EFFECT ON THE ELECTRICAL-PROPERTIES/, Journal of the Electrochemical Society, 143(3), 1996, pp. 56-58
Risultati:
1-7
|