Authors: SHAN FL WANG YM

Citation: Fl. Shan et Ym. Wang, X-RAY PROFILE ANALYSIS ON DISLOCATIONS AND HARDNESS OF COPPER-FILMS, Vacuum, 51(3), 1998, pp. 381-383

Authors: SHAN FL GAO ZM WANG YM

Citation: Fl. Shan et al., MICROHARDNESS EVALUATION OF CU-NI MULTILAYERED FILMS BY X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS, Thin solid films, 324(1-2), 1998, pp. 162-164

Authors: TENG FE MEI XX ZHANG QY WANG CZ SHAN FL YANG DZ WANG YM

Citation: Fe. Teng et al., THE MESOSCOPIC CHARACTERIZATION OF THE MICROHARDNESS OF SUPERHARD FILMS OF TAN, TAC AND TA(N,C), Journal of materials science letters, 15(18), 1996, pp. 1601-1604

Authors: TENG ZY WANG H LI JX SHAN FL TENG FE WANG YM

Citation: Zy. Teng et al., FINE-STRUCTURE CHARACTERIZATION OF STRESS-STRAIN CURVES FOR DEFORMED AUSTENITIC STAINLESS-STEELS, Journal of materials science letters, 14(4), 1995, pp. 289-290