AAAAAA

   
Results: 1-14 |
Results: 14

Authors: KOIKE H ENDA T MATSUOKA F SHIGYO N
Citation: H. Koike et al., COUNTER-DOPED SURFACE CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR WITH HIGH-CURRENT DRIVABILITY AND STEEP SUBTHRESHOLD SLOPE, JPN J A P 1, 37(10), 1998, pp. 5503-5506

Authors: IGA K ISHIBASHI K SHIGYO N MATSUFUJI N NAKAMOTO T MAEHATA K NUMAJIRI M MEIGO S TAKADA H CHIBA S NAKAMURA T WATANABE Y
Citation: K. Iga et al., MEASUREMENT OF GAMMA-RAY PRODUCTION DOUBLE-DIFFERENTIAL CROSS-SECTIONS FOR THE SPALLATION REACTION INDUCED BY 0.8, 1.5 AND 3.0 GEV PROTONS, Journal of Nuclear Science and Technology, 35(5), 1998, pp. 329-334

Authors: SHIGYO N ISHIBASHI K IGA K KITSUKI H ARIMA H
Citation: N. Shigyo et al., INCORPORATION OF THE FRAGMENTATION PROCESS INTO HIGH-ENERGY TRANSPORTCODE (HETC), Journal of Nuclear Science and Technology, 35(2), 1998, pp. 87-92

Authors: SHIGYO N SHIMANE T SUDA M ENDA T FUKUDA S
Citation: N. Shigyo et al., VERIFICATION OF SATURATION VELOCITY LOWERING IN MOSFETS INVERSION LAYER, I.E.E.E. transactions on electron devices, 45(2), 1998, pp. 460-464

Authors: NAKAMOTO T ISHIBASHI K MATSUFUJI N SHIGYO N MAEHATA K ARIMA H MEIGO S TAKADA H CHIBA S NUMAJIRI M
Citation: T. Nakamoto et al., EXPERIMENTAL NEUTRON-PRODUCTION DOUBLE-DIFFERENTIAL CROSS-SECTION FORTHE NUCLEAR-REACTION BY 1,5-GEV PI(+) MESONS INCIDENT ON IRON, Journal of Nuclear Science and Technology, 34(8), 1997, pp. 860-862

Authors: ISHIBASHI K TAKADA H NAKAMOTO T SHIGYO N MAEHATA K MATSUFUJI N MEIGO SI CHIBA S NUMAJIRI M WATANABE Y NAKAMURA T
Citation: K. Ishibashi et al., MEASUREMENT OF NEUTRON-PRODUCTION DOUBLE-DIFFERENTIAL CROSS-SECTIONS FOR NUCLEAR SPALLATION REACTION INDUCED BY 0.8, 1.5 AND 3.0 GEV PROTONS, Journal of Nuclear Science and Technology, 34(6), 1997, pp. 529-537

Authors: YOSHIMI M TERAUCHI M NISHIYAMA A ARISUMI O MURAKOSHI AR MATSUZAWA K SHIGYO N TAKENO S TOMITA M SUZUKI K USHIKU Y TANGO H
Citation: M. Yoshimi et al., SUPPRESSION OF THE FLOATING-BODY EFFECT IN SOI MOSFETS BY THE BANDGAPENGINEERING METHOD USING A SI1-XGEX SOURCE STRUCTURE, I.E.E.E. transactions on electron devices, 44(3), 1997, pp. 423-430

Authors: TERAUCHI M SHIGYO N NITAYAMA A HORIGUCHI F
Citation: M. Terauchi et al., DEPLETION ISOLATION EFFECT OF SURROUNDING GATE TRANSISTORS, I.E.E.E. transactions on electron devices, 44(12), 1997, pp. 2303-2305

Authors: ENDA T SHIGYO N
Citation: T. Enda et N. Shigyo, ALLEVIATION OF SUBTHRESHOLD SWING AND SHORT-CHANNEL EFFECT IN BURIED-CHANNEL MOSFETS - THE COUNTER-DOPED SURFACE-CHANNEL MOSFET STRUCTURE, Electronics & communications in Japan. Part 2, Electronics, 79(11), 1996, pp. 43-50

Authors: ARISUMI O MATSUZAWA K SHIGYO N TERAUCHI M NISHIYAMA A YOSHIMI M
Citation: O. Arisumi et al., ANALYSIS OF SI-GE SOURCE STRUCTURE IN 0.15 MU-M SOI MOSFETS USING 2-DIMENSIONAL DEVICE SIMULATION, JPN J A P 1, 35(2B), 1996, pp. 992-995

Authors: NAKAMOTO T ISHIBASHI K MATSUFUJI N SHIGYO N MAEHATA K
Citation: T. Nakamoto et al., CHARGED-PARTICLE IDENTIFICATION INCLUDING PIONS BY PULSE-SHAPE DISCRIMINATION WITH AN NE213 LIQUID SCINTILLATOR, Review of scientific instruments, 66(11), 1995, pp. 5327-5330

Authors: NAKAMOTO T ISHIBASHI K MATSUFUJI N SHIGYO N MAEHATA K MEIGO S TAKADA H CHIBA S NUMAJIRI M NAKAMURA T WATANABE Y
Citation: T. Nakamoto et al., SPALLATION NEUTRON MEASUREMENT BY THE TIME-OF-FLIGHT METHOD WITH A SHORE FLIGHT PATH, Journal of Nuclear Science and Technology, 32(9), 1995, pp. 827-833

Authors: SHIGYO N SAKAGUCHI S ISHIBASHI K WAKUTA Y
Citation: N. Shigyo et al., PARAMETERIZATION OF FRAGMENTATION CROSS-SECTION FOR PROTON-INDUCED SPALLATION REACTION, Journal of Nuclear Science and Technology, 32(1), 1995, pp. 1-7

Authors: SHIGYO N NIITSU Y
Citation: N. Shigyo et Y. Niitsu, PHYSICAL MODELS FOR BIPOLAR DEVICE SIMULATION AND THEIR EFFECTS ON CUTOFF FREQUENCY, I.E.E.E. transactions on electron devices, 40(11), 1993, pp. 2087-2089
Risultati: 1-14 |