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Results: 1-11 |
Results: 11
GAS-SENSING PROPERTIES OF INDIUM OXIDE THIN-FILM ON SILICON SUBSTRATEPREPARED BY SPIN-COATING METHOD
Authors: CHUNG WY SAKAI G SHIMANOE K MIURA N LEE DD YAMAZOE N
Citation: Wy. Chung et al., GAS-SENSING PROPERTIES OF INDIUM OXIDE THIN-FILM ON SILICON SUBSTRATEPREPARED BY SPIN-COATING METHOD, JPN J A P 1, 37(9A), 1998, pp. 4994-4998
A COMPACT SOLID-STATE AMPEROMETRIC SENSOR FOR DETECTION OF NO2 IN PPBRANGE
Authors: MIURA N ONO M SHIMANOE K YAMAZOE N
Citation: N. Miura et al., A COMPACT SOLID-STATE AMPEROMETRIC SENSOR FOR DETECTION OF NO2 IN PPBRANGE, Sensors and actuators. B, Chemical, 49(1-2), 1998, pp. 101-109
DILUTE HYDROGEN-SULFIDE SENSING PROPERTIES OF CUO-SNO2 THIN-FILM PREPARED BY LOW-PRESSURE EVAPORATION METHOD
Authors: TAMAKI J SHIMANOE K YAMADA Y YAMAMOTO Y MIURA N YAMAZOE N
Citation: J. Tamaki et al., DILUTE HYDROGEN-SULFIDE SENSING PROPERTIES OF CUO-SNO2 THIN-FILM PREPARED BY LOW-PRESSURE EVAPORATION METHOD, Sensors and actuators. B, Chemical, 49(1-2), 1998, pp. 121-125
PREPARATION OF INDIUM OXIDE THIN-FILM BY SPIN-COATING METHOD AND ITS GAS-SENSING PROPERTIES
Authors: CHUNG WY SAKAI G SHIMANOE K MIURA N LEE DD YAMAZOE N
Citation: Wy. Chung et al., PREPARATION OF INDIUM OXIDE THIN-FILM BY SPIN-COATING METHOD AND ITS GAS-SENSING PROPERTIES, Sensors and actuators. B, Chemical, 46(2), 1998, pp. 139-145
ACCURACY OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY NEAR THEDETECTION LIMIT
Authors: MORI Y KUBOTA K SHIMANOE K SAKON T
Citation: Y. Mori et al., ACCURACY OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY NEAR THEDETECTION LIMIT, Analytical sciences, 14(2), 1998, pp. 275-280
SPIN-COATED THIN-FILMS OF SIO2-WO3 COMPOSITES FOR DETECTION OF SUB-PPM NO2
Authors: WANG XS SAKAI G SHIMANOE K MIURA N YAMAZOE N
Citation: Xs. Wang et al., SPIN-COATED THIN-FILMS OF SIO2-WO3 COMPOSITES FOR DETECTION OF SUB-PPM NO2, Sensors and actuators. B, Chemical, 45(2), 1997, pp. 141-146
A DEPTH PROFILE FITTING MODEL FOR A COMMERCIAL TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETER
Authors: MORI Y UEMURA K SHIMANOE K
Citation: Y. Mori et al., A DEPTH PROFILE FITTING MODEL FOR A COMMERCIAL TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETER, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 823-828
STUDY OF DEPTH DISTRIBUTION SHIFT OF COPPER ON SILICON-WAFER SURFACE USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
Authors: MORI Y SHIMANOE K
Citation: Y. Mori et K. Shimanoe, STUDY OF DEPTH DISTRIBUTION SHIFT OF COPPER ON SILICON-WAFER SURFACE USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, Analytical sciences, 12(2), 1996, pp. 277-279
STANDARD SAMPLE PREPARATION FOR THE ANALYSIS OF SEVERAL METALS ON SILICON-WAFER
Authors: MORI Y SHIMANOE K
Citation: Y. Mori et K. Shimanoe, STANDARD SAMPLE PREPARATION FOR THE ANALYSIS OF SEVERAL METALS ON SILICON-WAFER, Analytical sciences, 12(1), 1996, pp. 141-143
A STANDARD SAMPLE PREPARATION METHOD FOR THE DETERMINATION OF METAL IMPURITIES ON A SILICON-WAFER BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
Authors: MORI Y SHIMANOE K SAKON T
Citation: Y. Mori et al., A STANDARD SAMPLE PREPARATION METHOD FOR THE DETERMINATION OF METAL IMPURITIES ON A SILICON-WAFER BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, Analytical sciences, 11(3), 1995, pp. 499-504
ADSORPTION SPECIES OF TRANSITION-METAL IONS ON SILICON-WAFER IN SC-1 SOLUTION
Authors: MORI Y UEMURA K SHIMANOE K
Citation: Y. Mori et al., ADSORPTION SPECIES OF TRANSITION-METAL IONS ON SILICON-WAFER IN SC-1 SOLUTION, Journal of the Electrochemical Society, 142(9), 1995, pp. 3104-3109
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