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Results: 1-8 |
Results: 8
DEPOSITION OF FILMS WITH ION MIXING IN A PULSE EXPLOSIVE EMISSION DIODE
Authors: KORENEV SA BALYKIN NI SIKOLENKO VV ORELOVICH OL SHIROKOV DM
Citation: Sa. Korenev et al., DEPOSITION OF FILMS WITH ION MIXING IN A PULSE EXPLOSIVE EMISSION DIODE, Instruments and experimental techniques, 38(3), 1995, pp. 411-416
APPLICATION OF THE ERD METHOD FOR HYDROGEN DETERMINATION IN SILICON (OXY)NITRIDE THIN-FILMS PREPARED BY ECR PLASMA DEPOSITION
Authors: HRUBCIN L HURAN J SANDRIK R KOBZEV AP SHIROKOV DM
Citation: L. Hrubcin et al., APPLICATION OF THE ERD METHOD FOR HYDROGEN DETERMINATION IN SILICON (OXY)NITRIDE THIN-FILMS PREPARED BY ECR PLASMA DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 60-62
INVESTIGATION OF THE ELEMENTS DEPTH PROFILES IN SURFACE-LAYERS OF GLASS MODIFIED BY ION-BEAM-ASSISTED DEPOSITION
Authors: DUVANOV SM KOBZEV AP TOLOPA AM SHIROKOV DM
Citation: Sm. Duvanov et al., INVESTIGATION OF THE ELEMENTS DEPTH PROFILES IN SURFACE-LAYERS OF GLASS MODIFIED BY ION-BEAM-ASSISTED DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 264-267
NEW COMPUTER ITERATIVE FITTING PROGRAM DVBS FOR BACKSCATTERING ANALYSIS
Authors: BOHAC V SHIROKOV DM
Citation: V. Bohac et Dm. Shirokov, NEW COMPUTER ITERATIVE FITTING PROGRAM DVBS FOR BACKSCATTERING ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84(4), 1994, pp. 497-506
CHANGES IN-DEPTH PROFILES OF OXYGEN AND COPPER IN Y-BA-CU-O FILM UNDER ANNEALING
Authors: CHERNENKO LP KOBZEV AP KORNEEV DA SHIROKOV DM
Citation: Lp. Chernenko et al., CHANGES IN-DEPTH PROFILES OF OXYGEN AND COPPER IN Y-BA-CU-O FILM UNDER ANNEALING, Mikrochimica acta, 114, 1994, pp. 239-245
DAMAGE IN Y-BA-CU-O FILMS PRODUCED BY HE-4 IONS
Authors: CHERNENKO LP KOBZEV AP KORNEEV DA SHIROKOV DM
Citation: Lp. Chernenko et al., DAMAGE IN Y-BA-CU-O FILMS PRODUCED BY HE-4 IONS, Mikrochimica acta, 114, 1994, pp. 247-254
APPLICATION OF PIXE AND RBS METHODS IN THE ANALYSIS OF THIN-FILMS OF HIGH-TC SUPERCONDUCTORS
Authors: SANDRIK R KOBZEV AP SHIROKOV DM KLIMENT V
Citation: R. Sandrik et al., APPLICATION OF PIXE AND RBS METHODS IN THE ANALYSIS OF THIN-FILMS OF HIGH-TC SUPERCONDUCTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 392-396
ANALYSIS OF DEFECT DISTRIBUTION IN YBA2CU 307 EPITAXIAL-FILMS BY THE ION CHANNELING METHOD
Authors: VERBITSKAYA EM EREMIN VK KOBZEV AP KONNIKOV SG STROKAN NB SHIROKOV DM
Citation: Em. Verbitskaya et al., ANALYSIS OF DEFECT DISTRIBUTION IN YBA2CU 307 EPITAXIAL-FILMS BY THE ION CHANNELING METHOD, Zurnal tehniceskoj fiziki, 63(5), 1993, pp. 111-116
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