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DAGUANNO G
SIBILIA C
FAZIO E
FERRARI E
BERTOLOTTI M
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Authors:
BERTOLOTTI M
LIAKHOU GL
VOTI RL
PAOLONI S
SIBILIA C
Citation: M. Bertolotti et al., PROBE-BEAM INCIDENCE ANGLE-EFFECTS ON THERMAL-DIFFUSIVITY MEASUREMENTBY PHOTOTHERMAL DEFLECTION TECHNIQUE, Applied physics. B, Lasers and optics, 67(5), 1998, pp. 641-646
Authors:
SIBILIA C
NEFEDOV IS
SCALORA M
BERTOLOTTI M
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Authors:
HOEKSTRA HJWM
LAMBECK PV
KRIJNEN GJM
CTYROKY J
DEMINICIS M
SIBILIA C
CONRADI O
HELFERT S
PREGLA R
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BERTOLOTTI M
LIAKHOU GL
LIVOTI R
PAOLONI S
SIBILIA C
Citation: M. Bertolotti et al., THERMAL-WAVE RESONATOR - IN-SITU INVESTIGATION BY PHOTOTHERMAL DEFLECTION TECHNIQUE, International journal of thermophysics, 19(2), 1998, pp. 603-613
Authors:
FAZIO E
ZITELLI M
DOMINICI S
SIBILIA C
DAGUANNO G
BERTOLOTTI M
Citation: E. Fazio et al., PHASE-DRIVEN PULSE BREAKING DURING PERFECTLY-MATCHED 2ND-HARMONIC GENERATION, Optics communications, 148(4-6), 1998, pp. 427-435
Authors:
BERTOLOTTI M
LIAKHOU GL
LIVOTI R
PAOLONI S
SIBILIA C
Citation: M. Bertolotti et al., ANALYSIS OF THE PHOTOTHERMAL DEFLECTION TECHNIQUE IN THE SURFACE REFLECTION SCHEME - THEORY AND EXPERIMENT, Journal of applied physics, 83(2), 1998, pp. 966-982
Authors:
CALEO L
SIBILIA C
MASCIULLI P
BERTOLOTTI M
Citation: L. Caleo et al., NONLINEAR-OPTICAL FILTERS BASED ON THE CASCADING 2ND-ORDER EFFECT, Journal of the Optical Society of America. B, Optical physics, 14(9), 1997, pp. 2315-2324
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BERTOLOTTI M
LIAKHOU G
VOTI RL
MATERA A
SIBILIA C
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Citation: M. Bertolotti et al., OPTICAL LOSSES CHARACTERIZATION IN WAVE-GUIDES THROUGH THE PHOTODEFLECTION METHOD, Optical engineering, 36(2), 1997, pp. 515-520
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BERTOLOTTI M
DOROGAN V
LIAKHOU G
VOTI RL
PAOLONI S
SIBILIA C
Citation: M. Bertolotti et al., NEW PHOTOTHERMAL DEFLECTION METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENT OF SEMICONDUCTOR WAFERS, Review of scientific instruments, 68(3), 1997, pp. 1521-1526
Authors:
BERTOLOTTI M
VOTI RL
MARCHETTI S
SIBILIA C
Citation: M. Bertolotti et al., INTERACTION OF SOLITON-LIKE BEAM IN A DIFFUSIVE NONLINEAR PLANAR WAVE-GUIDE, Optics communications, 133(1-6), 1997, pp. 578-586
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Authors:
BERTOLOTTI M
VOTI RL
PAOLONI S
SIBILIA C
LIAKHOU GL
Citation: M. Bertolotti et al., THICKNESS MEASUREMENT BY PHOTOTHERMAL DEFLECTION METHOD - BASIC INFLUENCE OF SURFACE CONDUCTANCE, Progress in Natural Science, 6, 1996, pp. 309-312
Authors:
BERTOLOTTI M
FALABELLA A
VOIT RL
PAOLONI S
SIBILIA C
LIAKHOU GL
Citation: M. Bertolotti et al., ANALYSIS OF THE PHOTOTHERMAL DEFLECTION METHOD IN THE BOUNCING SCHEME, Progress in Natural Science, 6, 1996, pp. 665-668