Authors: LOMOV AA SIROCHENKO VP IMAMOV RM

Citation: Aa. Lomov et al., STUDY OF GAAS ION-ALLOYED LAYERS WITH (10 0) AND (211) ORIENTATIONS BY THE 2-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD, Kristallografia, 38(4), 1993, pp. 272-274

Authors: LOMOV AA OSIPOV AF SIROCHENKO VP

Citation: Aa. Lomov et al., A PROCEDURE FOR INVESTIGATING THE NEAR-SURFACE LAYERS OF SILICON SINGLE-CRYSTALS BY THE METHOD OF 3-CRYTSTAL X-RAY-DIFFRACTOMETRY, Industrial laboratory, 59(2), 1993, pp. 173-177